Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits
Author(s)
Sodini, Charles G.; Nausieda, Ivan A.; Ryu, Kevin K.; He, David Da; Akinwande, Akintunde Ibitayo; Bulovic, Vladimir; ... Show more Show less
DownloadNausieda-2009-Dual Threshold Voltage Integrated Organic Technology for Ultralow-power Circuits.pdf (1.381Mb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
For the first time, we demonstrate control of organic thinfilm transistor's (OTFT) threshold voltage (V [subscript T]) by modifying the gate work function. We present a near-room-temperature, fully lithographic process to fabricate integrated pentacene dual V [subscript T] OTFTs suitable for large-area and flexible mixed signal circuits. Platinum and aluminum are used as the gate metals for the high V [subscript T] (more depletion-like) and low V [subscript T] (more enhancement-like) p-channel devices, respectively. The availability of a high V [subscript T] device enables area-efficient zero-VGS current source loads. We demonstrate positive noise margin inverters which use pico Watts of power and a 3 V supply. Compared to a single V [subscript T] implementation, the dual V [subscript T] inverter occupies an area that is 30Ã Â smaller, and is 17Ã Â faster. These results show that p-channel only organic technologies can produce functional and low-power circuits without integrating a complementary device.
Date issued
2009-12Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Microsystems Technology LaboratoriesJournal
IEEE International Electron Devices Meeting
Publisher
Institute of Electrical and Electronics Engineers
Citation
Nausieda, I. et al. “Dual threshold voltage integrated organic technology for ultralow-power circuits.” Electron Devices Meeting (IEDM), 2009 IEEE International. 2009. 1-4. © 2009, IEEE
Version: Final published version
Other identifiers
E-ISBN: 978-1-4244-5640-6
INSPEC Accession Number: 11207408
ISBN
978-1-4244-5639-0