| dc.contributor.author | Ramaswamy, Anand | |
| dc.contributor.author | Nunoya, Nobuhiro | |
| dc.contributor.author | Piels, Molly | |
| dc.contributor.author | Johansson, Leif A. | |
| dc.contributor.author | Coldren, Larry A. | |
| dc.contributor.author | Bowers, John E. | |
| dc.contributor.author | Hastings, Alexander S. | |
| dc.contributor.author | Williams, Keith J. | |
| dc.contributor.author | Klamkin, Jonathan | |
| dc.date.accessioned | 2010-12-14T17:17:43Z | |
| dc.date.available | 2010-12-14T17:17:43Z | |
| dc.date.issued | 2009-12 | |
| dc.date.submitted | 2009-10 | |
| dc.identifier.isbn | 978-1-4244-4788-6 | |
| dc.identifier.other | INSPEC Accession Number: 10999470 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/60287 | |
| dc.description.abstract | As photodiodes become more linear, accurately characterizing their linearity becomes very challenging. We compare the IMD3 results from a standard two tone measurement to those from a more complex three tone measurement technique. A Ge n-i-p waveguide photodetector on Silicon-on-Insulator (SOI) substrate is used for the comparison. Additionally, we analyze, via simulation, the limitations of the measurement system in determining the distortion of highly linear photodiodes. | en_US |
| dc.description.sponsorship | United States. Defense Advanced Research Projects Agency (PHORFRONT program under United States Air Force contract number FA8750-05- C-0265) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | IEEE | en_US |
| dc.title | Experimental analysis of two measurement techniques to characterize photodiode linearity | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Ramaswamy, A. et al. “Experimental analysis of two measurement techniques to characterize photodiode linearity.” Microwave Photonics, 2009. MWP '09. International Topical Meeting on. 2009. 1-4. ©2009 IEEE. | en_US |
| dc.contributor.department | Lincoln Laboratory | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.approver | Klamkin, Jonathan | |
| dc.contributor.mitauthor | Klamkin, Jonathan | |
| dc.relation.journal | International Topical Meeting on Microwave Photonics, 2009. MWP '09 | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| dspace.orderedauthors | Ramaswamy, Anand; Nunoya, Nobuhiro; Piels, Molly; Johansson, Leif A.; Coldren, Larry A.; Bowers, John E.; Hastings, Alexander S.; Williams, Keith J.; Klamkin, Jonathan | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
