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dc.contributor.authorRamaswamy, Anand
dc.contributor.authorNunoya, Nobuhiro
dc.contributor.authorPiels, Molly
dc.contributor.authorJohansson, Leif A.
dc.contributor.authorColdren, Larry A.
dc.contributor.authorBowers, John E.
dc.contributor.authorHastings, Alexander S.
dc.contributor.authorWilliams, Keith J.
dc.contributor.authorKlamkin, Jonathan
dc.date.accessioned2010-12-14T17:17:43Z
dc.date.available2010-12-14T17:17:43Z
dc.date.issued2009-12
dc.date.submitted2009-10
dc.identifier.isbn978-1-4244-4788-6
dc.identifier.otherINSPEC Accession Number: 10999470
dc.identifier.urihttp://hdl.handle.net/1721.1/60287
dc.description.abstractAs photodiodes become more linear, accurately characterizing their linearity becomes very challenging. We compare the IMD3 results from a standard two tone measurement to those from a more complex three tone measurement technique. A Ge n-i-p waveguide photodetector on Silicon-on-Insulator (SOI) substrate is used for the comparison. Additionally, we analyze, via simulation, the limitations of the measurement system in determining the distortion of highly linear photodiodes.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (PHORFRONT program under United States Air Force contract number FA8750-05- C-0265)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleExperimental analysis of two measurement techniques to characterize photodiode linearityen_US
dc.typeArticleen_US
dc.identifier.citationRamaswamy, A. et al. “Experimental analysis of two measurement techniques to characterize photodiode linearity.” Microwave Photonics, 2009. MWP '09. International Topical Meeting on. 2009. 1-4. ©2009 IEEE.en_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverKlamkin, Jonathan
dc.contributor.mitauthorKlamkin, Jonathan
dc.relation.journalInternational Topical Meeting on Microwave Photonics, 2009. MWP '09en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsRamaswamy, Anand; Nunoya, Nobuhiro; Piels, Molly; Johansson, Leif A.; Coldren, Larry A.; Bowers, John E.; Hastings, Alexander S.; Williams, Keith J.; Klamkin, Jonathan
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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