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dc.contributor.authorChung, SungWon
dc.contributor.authorDawson, Joel L.
dc.date.accessioned2011-01-07T21:44:17Z
dc.date.available2011-01-07T21:44:17Z
dc.date.issued2009-04
dc.identifier.urihttp://hdl.handle.net/1721.1/60412
dc.descriptionconference websiteen_US
dc.description.abstractWe present a digitally assisted subsampler, designed to serve as the downconversion path in adaptive predistorters for 800MHz–5.8GHz RF power amplifiers. We use digital averaging to overcome the noise folding problems of subsampling, obtaining a final SNDR of 73.1dB for signals centered about a 2.4GHz carrier. Using quadrature subsampling, we obtain both the I and Q samples from the same physical path and thereby eliminate IQ gain mismatch. When used as part of an adaptive predistortion system, the subsampler enables an EVM improvement of 3.2% and distortion products suppression of up to 7.6dB for 802.11g signals. The subsampler IC, designed in a 90nm CMOS process, consumes 6.0mW from a 1.2V supply.en_US
dc.description.sponsorshipFocus Center Research Program. Focus Center for Circuit & System Solutionsen_US
dc.language.isoen_US
dc.publisherVLSI-TSAen_US
dc.relation.isversionofhttp://vlsitsa.itri.org.tw/2009/General/en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleA 73.1dB SNDR Digitally Assisted Subsampler for RF Power Amplifier Linearization Systemsen_US
dc.typeArticleen_US
dc.identifier.citationChung, SungWon and Joel L. Dawson. "A 73.1dB SNDR Digitally Assisted Subsampler for RF Power Amplifier Linearization Systems." 6th International Symposium on VLSI Technology, Systems and Applications (2009 VLSI-TSA), 27-29, April 2009, Hsinchu, Taiwan. © 2009 VLSI-TSA.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.approverDawson, Joel L.
dc.contributor.mitauthorDawson, Joel L.
dc.contributor.mitauthorChung, SungWon
dc.relation.journal16th International Symposium on VLSI Technology, Systems and Applications (2009 VLSI-TSA)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsChung, SungWon; Dawson, Joel L.
dc.identifier.orcidhttps://orcid.org/0000-0002-3647-5089
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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