Tests for the elliptical symmetry of hyperspectral imaging data
Author(s)Niu, Sidi; Ingle, Vinay K.; Manolakis, Dimitris G.; Cooley, Thomas W.
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Accurate statistical models for hyperspectral imaging (HSI) data distribution are useful for many applications. A family of elliptically contoured distribution (ECD) has been investigated to model the unimodal ground cover classes. In this paper we propose to test the elliptical symmetry of real unimodal HSI clutters which will answer the question whether the family of ECD will provide an appropriate model for HSI data. We emphasize that the elliptical symmetry is an inherent feature shared by all ECDs. It is a prerequisite that real HSI clutters must pass these elliptical symmetry tests, so that the family of ECD can be qualified to model these data accurately.
Proceedings of SPIE--the International Society for Optical Engineering
Sidi Niu, Vinay K. Ingle, Dimitris G. Manolakis and Thomas W. Cooley, "Tests for the elliptical symmetry of hyperspectral imaging data", Proc. SPIE 7812, 78120D (2010); doi:10.1117/12.861055 © 2010 COPYRIGHT SPIE
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