Show simple item record

dc.contributor.authorNiu, Sidi
dc.contributor.authorIngle, Vinay K.
dc.contributor.authorManolakis, Dimitris G.
dc.contributor.authorCooley, Thomas W.
dc.date.accessioned2011-02-14T15:00:39Z
dc.date.available2011-02-14T15:00:39Z
dc.date.issued2010-08
dc.date.submitted2010-08
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/60938
dc.description.abstractAccurate statistical models for hyperspectral imaging (HSI) data distribution are useful for many applications. A family of elliptically contoured distribution (ECD) has been investigated to model the unimodal ground cover classes. In this paper we propose to test the elliptical symmetry of real unimodal HSI clutters which will answer the question whether the family of ECD will provide an appropriate model for HSI data. We emphasize that the elliptical symmetry is an inherent feature shared by all ECDs. It is a prerequisite that real HSI clutters must pass these elliptical symmetry tests, so that the family of ECD can be qualified to model these data accurately.en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.861055en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleTests for the elliptical symmetry of hyperspectral imaging dataen_US
dc.typeArticleen_US
dc.identifier.citationSidi Niu, Vinay K. Ingle, Dimitris G. Manolakis and Thomas W. Cooley, "Tests for the elliptical symmetry of hyperspectral imaging data", Proc. SPIE 7812, 78120D (2010); doi:10.1117/12.861055 © 2010 COPYRIGHT SPIEen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.approverManolakis, Dimitris G.
dc.contributor.mitauthorManolakis, Dimitris G.
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsNiu, Sidi; Ingle, Vinay K.; Manolakis, Dimitris G.; Cooley, Thomas W.en
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record