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EUV detection of high-frequency surface acoustic waves

Author(s)
Siemens, Mark; Li, Qing; Murname, Margaret M.; Kapteyn, Henry C.; Yang, Ronggui; Anderson, Erik; Nelson, Keith Adam; ... Show more Show less
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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Abstract
We use coherent extreme ultraviolet radiation to probe surface acoustic wave propagation in nickel-on-sapphire nanostructures. We observe no acoustic dispersion over SAW wavelengths down to 200 nm, meaning the SAW propagation is unaffected by the nanostructure.
Date issued
2009-08
URI
http://hdl.handle.net/1721.1/61657
Department
Massachusetts Institute of Technology. Department of Chemistry
Journal
Conference on Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum Electronics and Laser Science Conference. CLEO/QELS 2009.
Publisher
Institute of Electrical and Electronics Engineers
Citation
Siemens, Mark, et al. “EUV detection of high-frequency surface acoustic waves.” Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on. 2009. 1-2. ©2009 IEEE.
Version: Final published version
Other identifiers
INSPEC Accession Number: 10859314
ISBN
978-1-55752-869-8

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