| dc.contributor.author | Siemens, Mark | |
| dc.contributor.author | Li, Qing | |
| dc.contributor.author | Murname, Margaret M. | |
| dc.contributor.author | Kapteyn, Henry C. | |
| dc.contributor.author | Yang, Ronggui | |
| dc.contributor.author | Anderson, Erik | |
| dc.contributor.author | Nelson, Keith Adam | |
| dc.date.accessioned | 2011-03-10T21:34:18Z | |
| dc.date.available | 2011-03-10T21:34:18Z | |
| dc.date.issued | 2009-08 | |
| dc.date.submitted | 2009-06 | |
| dc.identifier.isbn | 978-1-55752-869-8 | |
| dc.identifier.other | INSPEC Accession Number: 10859314 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/61657 | |
| dc.description.abstract | We use coherent extreme ultraviolet radiation to probe surface acoustic wave propagation in nickel-on-sapphire nanostructures. We observe no acoustic dispersion over SAW wavelengths down to 200 nm, meaning the SAW propagation is unaffected by the nanostructure. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | IEEE | en_US |
| dc.title | EUV detection of high-frequency surface acoustic waves | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Siemens, Mark, et al. “EUV detection of high-frequency surface acoustic waves.” Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on. 2009. 1-2. ©2009 IEEE. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
| dc.contributor.approver | Nelson, Keith Adam | |
| dc.contributor.mitauthor | Nelson, Keith Adam | |
| dc.relation.journal | Conference on Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum Electronics and Laser Science Conference. CLEO/QELS 2009. | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| dspace.orderedauthors | Siemens, Mark; Li, Qing; Murnane, Margaret; Kapteyn, Henry; Yang, Ronggui; Anderson, Erik; Nelson, Keith | |
| dc.identifier.orcid | https://orcid.org/0000-0001-7804-5418 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
