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dc.contributor.authorOlguin Olguin, Daniel
dc.contributor.authorWaber, Benjamin Nathan
dc.contributor.authorKim, Taemie Jung
dc.contributor.authorMohan, Akshay
dc.contributor.authorAra, Koji
dc.contributor.authorPentland, Alex Paul
dc.date.accessioned2011-04-01T21:52:33Z
dc.date.available2011-04-01T21:52:33Z
dc.date.issued2008-12
dc.date.submitted2007-11
dc.identifier.issn1083-4419
dc.identifier.otherINSPEC Accession Number: 10391589
dc.identifier.urihttp://hdl.handle.net/1721.1/62024
dc.description.abstractWe present the design, implementation, and deployment of a wearable computing platform for measuring and analyzing human behavior in organizational settings. We propose the use of wearable electronic badges capable of automatically measuring the amount of face-to-face interaction, conversational time, physical proximity to other people, and physical activity levels in order to capture individual and collective patterns of behavior. Our goal is to be able to understand how patterns of behavior shape individuals and organizations. By using on-body sensors in large groups of people for extended periods of time in naturalistic settings, we have been able to identify, measure, and quantify social interactions, group behavior, and organizational dynamics. We deployed this wearable computing platform in a group of 22 employees working in a real organization over a period of one month. Using these automatic measurements, we were able to predict employees' self-assessments of job satisfaction and their own perceptions of group interaction quality by combining data collected with our platform and e-mail communication data. In particular, the total amount of communication was predictive of both of these assessments, and betweenness in the social network exhibited a high negative correlation with group interaction satisfaction. We also found that physical proximity and e-mail exchange had a negative correlation of r = -0.55 (p 0.01), which has far-reaching implications for past and future research on social networks.en_US
dc.description.sponsorshipHitachi, Ltd.en_US
dc.description.sponsorshipThings That Think Consortiumen_US
dc.description.sponsorshipAnalog Devices, inc.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TSMCB.2008.2006638en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleSensible organizations: Technology and methodology for automatically measuring organizational behavioren_US
dc.typeArticleen_US
dc.identifier.citationMohan, A., K. Ara, and A. Pentland, with Olguin, D.O., and B.N. Waber, Taemie Kim. “Sensible Organizations: Technology and Methodology for Automatically Measuring Organizational Behavior.” Systems, Man, and Cybernetics, Part B: Cybernetics, IEEE Transactions On 39.1 (2009) : 43-55. © 2008 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentProgram in Media Arts and Sciences (Massachusetts Institute of Technology)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Human Dynamics Groupen_US
dc.contributor.approverPentland, Alex Paul
dc.contributor.mitauthorOlguin Olguin, Daniel
dc.contributor.mitauthorWaber, Benjamin Nathan
dc.contributor.mitauthorKim, Taemie Jung
dc.contributor.mitauthorMohan, Akshay
dc.contributor.mitauthorPentland, Alex Paul
dc.relation.journalIEEE transactions on systems, man, and cybernetics. Part B, Cyberneticsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsOlguin, D.O.; Waber, B.N.; Taemie Kim, B.N.; Mohan, A.; Ara, K.; Pentland, A.en
dc.identifier.orcidhttps://orcid.org/0000-0002-0990-5960
dc.identifier.orcidhttps://orcid.org/0000-0002-8053-9983
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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