Nonparametric hierarchical Bayesian model for functional brain parcellation
Author(s)Lashkari, Danial; Sridharan, Ramesh; Vul, Edward; Hsieh, Po-Jang; Kanwisher, Nancy; Golland, Polina; ... Show more Show less
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We develop a method for unsupervised analysis of functional brain images that learns group-level patterns of functional response. Our algorithm is based on a generative model that comprises two main layers. At the lower level, we express the functional brain response to each stimulus as a binary activation variable. At the next level, we define a prior over the sets of activation variables in all subjects. We use a Hierarchical Dirichlet Process as the prior in order to simultaneously learn the patterns of response that are shared across the group, and to estimate the number of these patterns supported by data. Inference based on this model enables automatic discovery and characterization of salient and consistent patterns in functional signals. We apply our method to data from a study that explores the response of the visual cortex to a collection of images. The discovered profiles of activation correspond to selectivity to a number of image categories such as faces, bodies, and scenes. More generally, our results appear superior to the results of alternative data-driven methods in capturing the category structure in the space of stimuli.
DepartmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory; Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; McGovern Institute for Brain Research at MIT
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops.
Institute of Electrical and Electronics Engineers / IEEE Computer Society
Kanwisher, N., and P. Golland, with Lashkari, D., R. Sridharan, and E. Vul, Po-Jang Hsieh. “Nonparametric Hierarchical Bayesian Model for Functional Brain Parcellation.” Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference On. 2010. 15-22. Copyright © 2010, IEEE
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INSPEC Accession Number: 11466679