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dc.contributor.authorSubbarao, Samuel P.
dc.contributor.authorBahlke, Matthias Erhard
dc.contributor.authorKymissis, Ioannis
dc.date.accessioned2011-04-19T15:34:46Z
dc.date.available2011-04-19T15:34:46Z
dc.date.issued2010-01
dc.date.submitted2009-12
dc.identifier.issn0018-9383
dc.identifier.otherINSPEC Accession Number: 11024604
dc.identifier.urihttp://hdl.handle.net/1721.1/62227
dc.description.abstractWe present an approach, which is compatible with both glass and polymer substrates, to in-laboratory handling and intra-laboratory shipping of air-sensitive organic semiconductors. Encapsulation approaches are presented using polymer/ceramic and polymer/metal thin-film barriers using commercially available materials and generally available laboratory equipment. A technique for depositing an opaque vapor barrier, a transparent vapor barrier, and an approach to storing and shipping air-sensitive thin-film organic semiconductor devices on both polymer and glass substrates are presented. Barrier performance in air was tested using organic light-emitting diodes (OLEDs) as test devices. The half-life performance of OLEDs on plastic substrates in air exceeded 700 h, and that on glass exceeded 500 h. Commercially available heat-seal barrier bag systems for device shipping and storage in air were tested using a thin film of metallic calcium to test water permeation. More than four months of storage of a metallic calcium film in a heat-sealed foil bag was demonstrated in the best storage system. These approaches allow for the encapsulation of samples for longer duration testing and transportation than otherwise possible.en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research (STTR FA9550-07-C-0056 under a subcontract with QD Vision, Inc.)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ted.2009.2034804en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleLaboratory Thin-Film Encapsulation of Air-Sensitive Organic Semiconductor Devicesen_US
dc.typeArticleen_US
dc.identifier.citationSubbarao, S.P., M.E. Bahlke, and I. Kymissis. “Laboratory Thin-Film Encapsulation of Air-Sensitive Organic Semiconductor Devices.” Electron Devices, IEEE Transactions On 57.1 (2010) : 153-156. © 2010 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverBahlke, Matthias Erhard
dc.contributor.mitauthorBahlke, Matthias Erhard
dc.contributor.mitauthorKymissis, Ioannis
dc.relation.journalIEEE Transactions on Electron Devicesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSubbarao, Samuel P.; Bahlke, Matthias E.; Kymissis, Ioannisen
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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