dc.contributor.author | Subbarao, Samuel P. | |
dc.contributor.author | Bahlke, Matthias Erhard | |
dc.contributor.author | Kymissis, Ioannis | |
dc.date.accessioned | 2011-04-19T15:34:46Z | |
dc.date.available | 2011-04-19T15:34:46Z | |
dc.date.issued | 2010-01 | |
dc.date.submitted | 2009-12 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | INSPEC Accession Number: 11024604 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/62227 | |
dc.description.abstract | We present an approach, which is compatible with both glass and polymer substrates, to in-laboratory handling and intra-laboratory shipping of air-sensitive organic semiconductors. Encapsulation approaches are presented using polymer/ceramic and polymer/metal thin-film barriers using commercially available materials and generally available laboratory equipment. A technique for depositing an opaque vapor barrier, a transparent vapor barrier, and an approach to storing and shipping air-sensitive thin-film organic semiconductor devices on both polymer and glass substrates are presented. Barrier performance in air was tested using organic light-emitting diodes (OLEDs) as test devices. The half-life performance of OLEDs on plastic substrates in air exceeded 700 h, and that on glass exceeded 500 h. Commercially available heat-seal barrier bag systems for device shipping and storage in air were tested using a thin film of metallic calcium to test water permeation. More than four months of storage of a metallic calcium film in a heat-sealed foil bag was demonstrated in the best storage system. These approaches allow for the encapsulation of samples for longer duration testing and transportation than otherwise possible. | en_US |
dc.description.sponsorship | United States. Air Force Office of Scientific Research (STTR FA9550-07-C-0056 under a subcontract with QD Vision, Inc.) | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/ted.2009.2034804 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | IEEE | en_US |
dc.title | Laboratory Thin-Film Encapsulation of Air-Sensitive Organic Semiconductor Devices | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Subbarao, S.P., M.E. Bahlke, and I. Kymissis. “Laboratory Thin-Film Encapsulation of Air-Sensitive Organic Semiconductor Devices.” Electron Devices, IEEE Transactions On 57.1 (2010) : 153-156. © 2010 IEEE. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.approver | Bahlke, Matthias Erhard | |
dc.contributor.mitauthor | Bahlke, Matthias Erhard | |
dc.contributor.mitauthor | Kymissis, Ioannis | |
dc.relation.journal | IEEE Transactions on Electron Devices | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Subbarao, Samuel P.; Bahlke, Matthias E.; Kymissis, Ioannis | en |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |