Physical Fault Tolerance of Nanoelectronics
Author(s)Szkopek, Thomas; Roychowdhury, Vwani P.; Antoniadis, Dimitri A.; Damoulakis, John N.
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The error rate in complementary transistor circuits is suppressed exponentially in electron number, arising from an intrinsic physical implementation of fault-tolerant error correction. Contrariwise, explicit assembly of gates into the most efficient known fault-tolerant architecture is characterized by a subexponential suppression of error rate with electron number, and incurs significant overhead in wiring and complexity. We conclude that it is more efficient to prevent logical errors with physical fault tolerance than to correct logical errors with fault-tolerant architecture.
DepartmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Physical Review Letters
American Physical Society
Szkopek, Thomas et al. “Physical Fault Tolerance of Nanoelectronics.” Physical Review Letters 106 (2011). © 2011 American Physical Society.
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