| dc.contributor.author | MacLean, Kenneth | |
| dc.contributor.author | Mentzel, Tamar | |
| dc.contributor.author | Kastner, Marc | |
| dc.date.accessioned | 2011-12-15T14:01:40Z | |
| dc.date.available | 2011-12-15T14:01:40Z | |
| dc.date.issued | 2010-12 | |
| dc.identifier.issn | 1530-6984 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/67690 | |
| dc.description.abstract | We investigate the effect of electrostatic screening on a nanoscale silicon MOSFET electrometer. We find that screening by the lightly doped p-type substrate, on which the MOSFET is fabricated, significantly affects the sensitivity of the device. We are able to tune the rate and magnitude of the screening effect by varying the temperature and the voltages applied to the device, respectively. We show that despite this screening effect, the electrometer is still very sensitive to its electrostatic environment, even at room temperature. | en_US |
| dc.description.sponsorship | United States. Dept. of Energy (award DE-FG02-08ER46515) | en_US |
| dc.description.sponsorship | United States. Army Research Office (contract W911NF-07-D-0004) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | American Chemical Society | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1021/nl102121e | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Prof. Kastner via Mat Willmott | en_US |
| dc.title | The Effect of Electrostatic Screening on a Nanometer Scale Electrometer | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | MacLean, Kenneth, Tamar S. Mentzel, and Marc A. Kastner. “The Effect of Electrostatic Screening on a Nanometer Scale Electrometer.” Nano Letters 11.1 (2011): 30-34. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
| dc.contributor.approver | Kastner, Marc | |
| dc.contributor.mitauthor | MacLean, Kenneth | |
| dc.contributor.mitauthor | Mentzel, Tamar | |
| dc.contributor.mitauthor | Kastner, Marc | |
| dc.relation.journal | Nano Letters | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A. | en |
| dc.identifier.orcid | https://orcid.org/0000-0001-7641-5438 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
