MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Bayesian Nonparametric Methods for Learning Markov Switching Processes

Author(s)
Fox, Emily Beth; Willsky, Alan S.; Sudderth, Erik B.; Jordan, Michael I.
Thumbnail
DownloadFox-2010-Bayesian Nonparametr.pdf (1.118Mb)
PUBLISHER_POLICY

Publisher Policy

Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Abstract
In this article, we explored a Bayesian nonparametric approach to learning Markov switching processes. This framework requires one to make fewer assumptions about the underlying dynamics, and thereby allows the data to drive the complexity of the inferred model. We began by examining a Bayesian nonparametric HMM, the sticky HDPHMM, that uses a hierarchical DP prior to regularize an unbounded mode space. We then considered extensions to Markov switching processes with richer, conditionally linear dynamics, including the HDP-AR-HMM and HDP-SLDS. We concluded by considering methods for transferring knowledge among multiple related time series. We argued that a featural representation is more appropriate than a rigid global clustering, as it encourages sharing of behaviors among objects while still allowing sequence-specific variability. In this context, the beta process provides an appealing alternative to the DP.
Date issued
2010-11
URI
http://hdl.handle.net/1721.1/69030
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Journal
IEEE Signal Processing Magazine
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Fox, Emily et al. “Bayesian Nonparametric Methods for Learning Markov Switching Processes.” IEEE Signal Processing Magazine (2010): n. pag. Web. 3 Feb. 2012. © 2011 Institute of Electrical and Electronics Engineers
Version: Final published version
Other identifiers
INSPEC Accession Number: 11588731
ISSN
1053-5888

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.