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dc.contributor.authorFox, Emily Beth
dc.contributor.authorWillsky, Alan S.
dc.contributor.authorSudderth, Erik B.
dc.contributor.authorJordan, Michael I.
dc.date.accessioned2012-02-03T19:29:20Z
dc.date.available2012-02-03T19:29:20Z
dc.date.issued2010-11
dc.identifier.issn1053-5888
dc.identifier.otherINSPEC Accession Number: 11588731
dc.identifier.urihttp://hdl.handle.net/1721.1/69030
dc.description.abstractIn this article, we explored a Bayesian nonparametric approach to learning Markov switching processes. This framework requires one to make fewer assumptions about the underlying dynamics, and thereby allows the data to drive the complexity of the inferred model. We began by examining a Bayesian nonparametric HMM, the sticky HDPHMM, that uses a hierarchical DP prior to regularize an unbounded mode space. We then considered extensions to Markov switching processes with richer, conditionally linear dynamics, including the HDP-AR-HMM and HDP-SLDS. We concluded by considering methods for transferring knowledge among multiple related time series. We argued that a featural representation is more appropriate than a rigid global clustering, as it encourages sharing of behaviors among objects while still allowing sequence-specific variability. In this context, the beta process provides an appealing alternative to the DP.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/msp.2010.937999en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleBayesian Nonparametric Methods for Learning Markov Switching Processesen_US
dc.typeArticleen_US
dc.identifier.citationFox, Emily et al. “Bayesian Nonparametric Methods for Learning Markov Switching Processes.” IEEE Signal Processing Magazine (2010): n. pag. Web. 3 Feb. 2012. © 2011 Institute of Electrical and Electronics Engineersen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverWillskey, Alan S.
dc.contributor.mitauthorFox, Emily Beth
dc.contributor.mitauthorWillsky, Alan S.
dc.relation.journalIEEE Signal Processing Magazineen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsFox, Emily; Sudderth, Erik; Jordan, Michael; Willsky, Alanen
dc.identifier.orcidhttps://orcid.org/0000-0003-0149-5888
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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