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dc.contributor.authorMacLean, Kenneth
dc.contributor.authorMentzel, Tamar
dc.contributor.authorKastner, Marc
dc.date.accessioned2012-02-14T13:57:20Z
dc.date.available2012-02-14T13:57:20Z
dc.date.issued2010-03
dc.date.submitted2009-12
dc.identifier.issn1530-6984
dc.identifier.issn1530-6992
dc.identifier.urihttp://hdl.handle.net/1721.1/69097
dc.description.abstractWe measure charge transport in a hydrogenated amorphous silicon (a-Si:H) thin film using a nanometer scale silicon MOSFET as a charge sensor. This charge detection technique makes possible the measurement of extremely large resistances even in the presence of blocking contacts. At high temperatures, where the resistance of the a-Si:H is not too large, the charge detection measurement agrees with a direct measurement of current. The device geometry allows us to probe both the field effect and dispersive transport in the a-Si:H using charge sensing and to extract the density of states near the Fermi energy.en_US
dc.description.sponsorshipUnited States. Army Research Office (contract W911NF-07-D-0004)en_US
dc.description.sponsorshipUnited States. Dept. of Energy (award DE-FG02-08ER46515)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/nl904280qen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceProf. Kastneren_US
dc.titleMeasuring Charge Transport in a Thin Solid Film Using Charge Sensingen_US
dc.typeArticleen_US
dc.identifier.citationMacLean, Kenneth, Tamar S. Mentzel, and Marc A. Kastner. “Measuring Charge Transport in a Thin Solid Film Using Charge Sensing.” Nano Letters 10.3 (2010): 1037-1040.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.approverKastner, Marc
dc.contributor.mitauthorMacLean, Kenneth
dc.contributor.mitauthorMentzel, Tamar
dc.contributor.mitauthorKastner, Marc
dc.relation.journalNano Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsMacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A.en
dc.identifier.orcidhttps://orcid.org/0000-0001-7641-5438
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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