dc.contributor.author | MacLean, Kenneth | |
dc.contributor.author | Mentzel, Tamar | |
dc.contributor.author | Kastner, Marc | |
dc.date.accessioned | 2012-02-14T13:57:20Z | |
dc.date.available | 2012-02-14T13:57:20Z | |
dc.date.issued | 2010-03 | |
dc.date.submitted | 2009-12 | |
dc.identifier.issn | 1530-6984 | |
dc.identifier.issn | 1530-6992 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/69097 | |
dc.description.abstract | We measure charge transport in a hydrogenated amorphous silicon (a-Si:H) thin film using a nanometer scale silicon MOSFET as a charge sensor. This charge detection technique makes possible the measurement of extremely large resistances even in the presence of blocking contacts. At high temperatures, where the resistance of the a-Si:H is not too large, the charge detection measurement agrees with a direct measurement of current. The device geometry allows us to probe both the field effect and dispersive transport in the a-Si:H using charge sensing and to extract the density of states near the Fermi energy. | en_US |
dc.description.sponsorship | United States. Army Research Office (contract W911NF-07-D-0004) | en_US |
dc.description.sponsorship | United States. Dept. of Energy (award DE-FG02-08ER46515) | en_US |
dc.language.iso | en_US | |
dc.publisher | American Chemical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1021/nl904280q | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | Prof. Kastner | en_US |
dc.title | Measuring Charge Transport in a Thin Solid Film Using Charge Sensing | en_US |
dc.type | Article | en_US |
dc.identifier.citation | MacLean, Kenneth, Tamar S. Mentzel, and Marc A. Kastner. “Measuring Charge Transport in a Thin Solid Film Using Charge Sensing.” Nano Letters 10.3 (2010): 1037-1040. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
dc.contributor.approver | Kastner, Marc | |
dc.contributor.mitauthor | MacLean, Kenneth | |
dc.contributor.mitauthor | Mentzel, Tamar | |
dc.contributor.mitauthor | Kastner, Marc | |
dc.relation.journal | Nano Letters | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | MacLean, Kenneth; Mentzel, Tamar S.; Kastner, Marc A. | en |
dc.identifier.orcid | https://orcid.org/0000-0001-7641-5438 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |