Finite-geometry models of electric field noise from patch potentials in ion traps
Author(s)Low, Guang Hao; Herskind, Peter F.; Chuang, Isaac L.
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We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained for several generic geometries of relevance to current ion trap designs, ranging from planar to spheroidal electrodes. The influence of patch size is studied both by solving Laplace's equation in terms of the appropriate Green's function as well as through an eigenfunction expansion. Scaling with surface distance is found to be highly dependent on the choice of geometry and the relative scale between the spatial extent of the electrode, the ion-electrode distance, and the patch size. Our model generally supports the d[superscript −4] dependence currently found by most experiments and models, but also predicts geometry-driven deviations from this trend.
DepartmentMassachusetts Institute of Technology. Department of Physics; Massachusetts Institute of Technology. Research Laboratory of Electronics; MIT-Harvard Center for Ultracold Atoms
Physical Review A
American Physical Society (APS)
Low, Guang Hao, Peter Herskind, and Isaac Chuang. “Finite-geometry Models of Electric Field Noise from Patch Potentials in Ion Traps.” Physical Review A 84.5 (2011): n. pag. Web. 2 Mar. 2012. © 2011 American Physical Society
Final published version