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dc.contributor.authorLow, Guang Hao
dc.contributor.authorHerskind, Peter F.
dc.contributor.authorChuang, Isaac L.
dc.date.accessioned2012-03-02T18:28:21Z
dc.date.available2012-03-02T18:28:21Z
dc.date.issued2011-11
dc.date.submitted2011-09
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/69568
dc.description.abstractWe model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained for several generic geometries of relevance to current ion trap designs, ranging from planar to spheroidal electrodes. The influence of patch size is studied both by solving Laplace's equation in terms of the appropriate Green's function as well as through an eigenfunction expansion. Scaling with surface distance is found to be highly dependent on the choice of geometry and the relative scale between the spatial extent of the electrode, the ion-electrode distance, and the patch size. Our model generally supports the d[superscript −4] dependence currently found by most experiments and models, but also predicts geometry-driven deviations from this trend.en_US
dc.description.sponsorshipMIT-Harvard Center for Ultracold Atomsen_US
dc.description.sponsorshipUnited States. Intelligence Advanced Research Projects Activity (SQIP program)en_US
dc.description.sponsorshipCarlsberg Foundationen_US
dc.description.sponsorshipLundbeck Foundationen_US
dc.language.isoen_US
dc.publisherAmerican Physical Society (APS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.84.053425en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleFinite-geometry models of electric field noise from patch potentials in ion trapsen_US
dc.typeArticleen_US
dc.identifier.citationLow, Guang Hao, Peter Herskind, and Isaac Chuang. “Finite-geometry Models of Electric Field Noise from Patch Potentials in Ion Traps.” Physical Review A 84.5 (2011): n. pag. Web. 2 Mar. 2012. © 2011 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMIT-Harvard Center for Ultracold Atomsen_US
dc.contributor.approverChuang, Isaac
dc.contributor.mitauthorLow, Guang Hao
dc.contributor.mitauthorToksoz, Peter F.
dc.contributor.mitauthorChuang, Isaac L.
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLow, Guang Hao; Herskind, Peter; Chuang, Isaacen
dc.identifier.orcidhttps://orcid.org/0000-0001-7296-523X
dc.identifier.orcidhttps://orcid.org/0000-0002-6211-982X
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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