Geometry-dependent critical currents in superconducting nanocircuits
Author(s)
Clem, John R.; Berggren, Karl K.
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In this paper, we calculate the critical currents in thin superconducting strips with sharp right-angle turns, 180∘ turnarounds, and more complicated geometries, where all the line widths are much smaller than the Pearl length Λ=2λ2/d. We define the critical current as the current that reduces the Gibbs-free-energy barrier to zero. We show that current crowding, which occurs whenever the current rounds a sharp turn, tends to reduce the critical current, but we also show that when the radius of curvature is less than the coherence length, this effect is partially compensated by a radius-of-curvature effect. We propose several patterns with rounded corners to avoid critical-current reduction due to current crowding. These results are relevant to superconducting nanowire single-photon detectors, where they suggest a means of improving the bias conditions and reducing dark counts. These results also have relevance to normal-metal nanocircuits, as these patterns can reduce the electrical resistance, electromigration, and hot spots caused by nonuniform heating.
Date issued
2011-11Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer ScienceJournal
Physical Review B
Publisher
American Physical Society
Citation
Clem, John, and Karl Berggren. “Geometry-dependent Critical Currents in Superconducting Nanocircuits.” Physical Review B 84.17 (2011): [27 pages].
Version: Final published version
ISSN
1098-0121
1550-235X