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dc.contributor.authorCheung, Kerry
dc.contributor.authorVelasquez-Heller, Luis Fernand
dc.contributor.authorAkinwande, Akintunde Ibitayo
dc.date.accessioned2012-04-04T18:07:41Z
dc.date.available2012-04-04T18:07:41Z
dc.date.issued2010-04
dc.identifier.isbn978-1-4244-5761-8
dc.identifier.isbn978-1-4244-5763-2
dc.identifier.issn1084-6999
dc.identifier.otherINSPEC Accession Number: 11229666
dc.identifier.urihttp://hdl.handle.net/1721.1/69930
dc.description.abstractWe report exciting experimental data from a low-cost, high-performance square electrode quadrupole mass filter with integrated ion optics intended for chips-cale mass spectrometry. The device showed a mass range of 650 amu and a maximum resolution of ~80, metrics that are comparable to the state-of-the-art. We demonstrated that operating our device in the second stability region leads to higher performance despite the unconventional electrode geometry. The data also suggests ion behavior that deviates from the standard circular rod case, motivating new studies.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Institute for Soldier Nanotechnologiesen_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency. Microsystems Technology Office (contract # W911QY-05-1-0002)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/MEMSYS.2010.5442344en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleHigh-performance MEMS square electrode quadrupole mass filters for chip-scale mass spectrometryen_US
dc.typeArticleen_US
dc.identifier.citationCheung, Kerry, Luis F. Velasquez-Garcia, and Akintunde I. Akinwande. “High-performance MEMS Square Electrode Quadrupole Mass Filters for Chip-scale Mass Spectrometry.” IEEE, 2010. 867–870. Web. 4 Apr. 2012. © 2010 Institute of Electrical and Electronics Engineersen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.approverCheung, Kerry
dc.contributor.mitauthorCheung, Kerry
dc.contributor.mitauthorVelasquez-Heller, Luis Fernand
dc.contributor.mitauthorAkinwande, Akintunde Ibitayo
dc.relation.journal2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsCheung, Kerry; Velasquez-Garcia, Luis F.; Akinwande, Akintunde I.en
dc.identifier.orcidhttps://orcid.org/0000-0003-3001-9223
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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