dc.contributor.author | Joh, Jungwoo | |
dc.contributor.author | del Alamo, Jesus A. | |
dc.date.accessioned | 2012-09-10T13:41:16Z | |
dc.date.available | 2012-09-10T13:41:16Z | |
dc.date.issued | 2011-06 | |
dc.date.submitted | 2011-04 | |
dc.identifier.isbn | 978-1-4244-9111-7 | |
dc.identifier.isbn | 978-1-4244-9113-1 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/72586 | |
dc.description.abstract | In this work, we investigate the time evolution of electrical degradation of GaN high electron mobility transistors under high voltage stress in the OFF state. We found that the gate current starts to degrade first, followed by degradation in current collapse and eventually permanent degradation in I[subscript D]. We also found that the time evolution of gate current degradation is unaffected by temperature, while drain current degradation is thermally accelerated. | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/IRPS.2011.5784511 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike 3.0 | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/ | en_US |
dc.source | MIT web domain | en_US |
dc.title | Time evolution of electrical degradation under high-voltage stress in GaN high electron mobility transistors | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Joh, Jungwoo, and Jesus A. del Alamo. “Time Evolution of Electrical Degradation Under High-voltage Stress in GaN High Electron Mobility Transistors.” IEEE International Reliability Physics Symposium 2011 (IRPS). 4E.3.1–4E.3.4. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Microsystems Technology Laboratories | en_US |
dc.contributor.approver | del Alamo, Jesus A. | |
dc.contributor.mitauthor | Joh, Jungwoo | |
dc.contributor.mitauthor | del Alamo, Jesus A. | |
dc.relation.journal | IEEE International Reliability Physics Symposium 2011 (IRPS) | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
dspace.orderedauthors | Joh, Jungwoo; del Alamo, Jesus A. | en |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |