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dc.contributor.authorWeller, Daniel Stuart
dc.contributor.authorGoyal, Vivek K.
dc.date.accessioned2012-09-10T18:59:57Z
dc.date.available2012-09-10T18:59:57Z
dc.date.issued2011-01
dc.date.submitted2010-10
dc.identifier.issn1053-587X
dc.identifier.urihttp://hdl.handle.net/1721.1/72601
dc.description.abstractMinimum mean-square error (MMSE) estimators of signals from samples corrupted by jitter (timing noise) and additive noise are nonlinear, even when the signal parameters and additive noise have normal distributions. This paper develops a stochastic algorithm based on Gibbs sampling and slice sampling to approximate the optimal MMSE estimator in this Bayesian formulation. Simulations demonstrate that this nonlinear algorithm can improve significantly upon the linear MMSE estimator, as well as the EM algorithm approximation to the maximum likelihood (ML) estimator used in classical estimation. Effective off-chip postprocessing to mitigate jitter enables greater jitter to be tolerated, potentially reducing on-chip ADC power consumption.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/tsp.2011.2108289en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourcearXiven_US
dc.titleBayesian Post-Processing Methods for Jitter Mitigation in Samplingen_US
dc.typeArticleen_US
dc.identifier.citationWeller, Daniel S., and Vivek K Goyal. “Bayesian Post-Processing Methods for Jitter Mitigation in Sampling.” IEEE Transactions on Signal Processing 59.5 (2011): 2112–2123.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverGoyal, Vivek K.
dc.contributor.mitauthorWeller, Daniel Stuart
dc.contributor.mitauthorGoyal, Vivek K.
dc.relation.journalIEEE Transactions on Signal Processingen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsWeller, Daniel S.; Goyal, Vivek Ken
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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