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dc.contributor.authorVanhoutte, Michiel
dc.contributor.authorWang, Bing
dc.contributor.authorMichel, Jurgen
dc.contributor.authorKimerling, Lionel C.
dc.date.accessioned2012-09-27T21:21:42Z
dc.date.available2012-09-27T21:21:42Z
dc.date.issued2009-09
dc.identifier.isbn978-1-4244-4403-8
dc.identifier.urihttp://hdl.handle.net/1721.1/73453
dc.description.abstractThe structural and photoluminescence properties of ytterbium-erbium silicate thin films have been investigated. The films were fabricated by RF-magnetron co-sputtering of Er[subscript 2]O[subscript 3], Yb[subscript 2]O[subscript 3] and SiO[subscript 2] on c-Si and subsequent annealing in N[subscript 2] or O[subscript 2] atmosphere.en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research. Multidisciplinary University Research Initiativeen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/GROUP4.2009.5338289en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleProcessing and properties of ytterbium-erbium silicate thin film gain mediaen_US
dc.typeArticleen_US
dc.identifier.citationVanhoutte, Michiel et al. “Processing and properties of ytterbium-erbium silicate thin film gain media.” IEEE, 2009. 63-65. © Copyright 2009 IEEEen_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microphotonics Centeren_US
dc.contributor.mitauthorKimerling, Lionel C.
dc.contributor.mitauthorVanhoutte, Michiel
dc.contributor.mitauthorWang, Bing
dc.contributor.mitauthorMichel, Jurgen
dc.relation.journalProceedings of the 6th IEEE International Conference on Group IV Photonics, 2009 (GFP '09)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsVanhoutte, Michiel; Wang, Bing; Michel, Jurgen; Kimerling, Lionel C.en
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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