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dc.contributor.authorSage, Jeremy M.
dc.contributor.authorKerman, Andrew J.
dc.contributor.authorChiaverini, John
dc.date.accessioned2012-10-10T19:29:49Z
dc.date.available2012-10-10T19:29:49Z
dc.date.issued2012-07
dc.date.submitted2012-05
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/73869
dc.description.abstractWe demonstrate loading of ions into a surface-electrode trap (SET) from a remote, laser-cooled source of neutral atoms. We first cool and load ∼10[superscript 6] neutral [superscript 88]Sr atoms into a magneto-optical trap from an oven that has no line of sight with the SET. The cold atoms are then pushed with a resonant laser into the trap region where they are subsequently photoionized and trapped in an SET operated at a cryogenic temperature of 4.6 K. We present studies of the loading process and show that our technique achieves ion loading into a shallow (15 meV depth) trap at rates as high as 125 ions/s while drastically reducing the amount of metal deposition on the trap surface as compared with direct loading from a hot vapor. Furthermore, we note that due to multiple stages of isotopic filtering in our loading process, this technique has the potential for enhanced isotopic selectivity over other loading methods. Rapid loading from a clean, isotopically pure, and precooled source may enable scalable quantum-information processing with trapped ions in large, low-depth surface-trap arrays that are not amenable to loading from a hot atomic beam.en_US
dc.description.sponsorshipUnited States. Air Force (Contract FA8721-05-C-0002)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.86.013417en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleLoading of a surface-electrode ion trap from a remote, precooled sourceen_US
dc.typeArticleen_US
dc.identifier.citationSage, Jeremy, Andrew Kerman, and John Chiaverini. “Loading of a Surface-electrode Ion Trap from a Remote, Precooled Source.” Physical Review A 86.1 (2012). ©2012 American Physical Societyen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.mitauthorSage, Jeremy M.
dc.contributor.mitauthorKerman, Andrew J.
dc.contributor.mitauthorChiaverini, John
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSage, Jeremy; Kerman, Andrew; Chiaverini, Johnen
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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