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dc.contributor.authorSood, Ashok K.
dc.contributor.authorRichwine, Robert A.
dc.contributor.authorSood, Adam W.
dc.contributor.authorPuri, Yash R.
dc.contributor.authorDiLello, Nicole Ann
dc.contributor.authorHoyt, Judy L.
dc.contributor.authorAkinwande, Tayo I.
dc.contributor.authorDhar, Nibir
dc.contributor.authorBalcerak, Raymond S.
dc.contributor.authorBramhall, Thomas G.
dc.date.accessioned2012-10-12T18:19:47Z
dc.date.available2012-10-12T18:19:47Z
dc.date.issued2011-05
dc.date.submitted2011-04
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/73942
dc.description.abstractSiGe based focal plane arrays offer a low cost alternative for developing visible- near-infrared focal plane arrays that will cover the spectral band from 0.4 to 1.6 microns. The attractive features of SiGe based foal plane arrays take advantage of silicon based technology that promises small feature size, low dark current and compatibility with the low power silicon CMOS circuits for signal processing. This paper discusses performance characteristics for the SiGe based VIS-NIR Sensors for a variety of defense and commercial applications using small unit cell size and compare performance with InGaAs, InSb, and HgCdTe IRFPA's. We present results on the approach and device design for reducing the dark current in SiGe detector arrays. The electrical and optical properties of SiGe arrays at room temperature are discussed. We also discuss future integration path for SiGe devices with Si-MEMS Bolometers.en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.889205en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleCharacterization of sige-detector arrays for visible-NIR imaging sensor applicationsen_US
dc.typeArticleen_US
dc.identifier.citationAshok K. Sood ; Robert A. Richwine ; Adam W. Sood ; Yash R. Puri ; Nicole DiLello ; Judy L. Hoyt ; Tayo I. Akinwande ; Nibir Dhar ; Raymond S. Balcerak ; Thomas G. Bramhall; Characterization of SiGe-detector arrays for visible-NIR imaging sensor applications. Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 801240 (May 20, 2011). Copyright © 2011 SPIE Digital Libraryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.mitauthorDiLello, Nicole Ann
dc.contributor.mitauthorHoyt, Judy L.
dc.contributor.mitauthorAkinwande, Tayo I.
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering; v. 8012en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSood, Ashok K.; Richwine, Robert A.; Sood, Adam W.; Puri, Yash R.; DiLello, Nicole; Hoyt, Judy L.; Akinwande, Tayo I.; Dhar, Nibir; Balcerak, Raymond S.; Bramhall, Thomas G.en
dc.identifier.orcidhttps://orcid.org/0000-0003-3001-9223
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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