Observation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritons

Author(s)
Bradley, Michael Scott; Bulovic, Vladimir
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Abstract
We present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary for achieving lasing.
Date issued
2010-07
URI
http://hdl.handle.net/1721.1/74096
Department
Lincoln Laboratory; Massachusetts Institute of Technology. Microsystems Technology Laboratories
Journal
Proceedings of the Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
M. Scott Bradley and Vladimir Bulovic. "Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010." IEEE. © Copyright 2010 IEEE
Version: Final published version
ISBN
978-1-55752-890-2
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