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  4. Observation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritons

Observation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritons

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Author(s)
Bradley, Michael Scott
•
Bulovic, Vladimir
Date Issued
July 2010
Journal
Proceedings of the Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
M. Scott Bradley and Vladimir Bulovic. "Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010." IEEE. © Copyright 2010 IEEE
Version
Final published version
Abstract
We present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary for achieving lasing.
MIT Department
Lincoln Laboratory
Massachusetts Institute of Technology. Microsystems Technology Laboratories
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/74096
DOI of Published Version
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5500669&tag=1
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