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dc.contributor.authorBradley, Michael Scott
dc.contributor.authorBulovic, Vladimir
dc.date.accessioned2012-10-18T18:25:35Z
dc.date.available2012-10-18T18:25:35Z
dc.date.issued2010-07
dc.date.submitted2010-05
dc.identifier.isbn978-1-55752-890-2
dc.identifier.urihttp://hdl.handle.net/1721.1/74096
dc.description.abstractWe present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary for achieving lasing.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5500669&tag=1en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleObservation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritonsen_US
dc.typeArticleen_US
dc.identifier.citationM. Scott Bradley and Vladimir Bulovic. "Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010." IEEE. © Copyright 2010 IEEEen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.mitauthorBradley, Michael Scott
dc.contributor.mitauthorBulovic, Vladimir
dc.relation.journalProceedings of the Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-0960-2580
mit.licensePUBLISHER_POLICYen_US


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