dc.contributor.author | Vitale, Steven A. | |
dc.contributor.author | Wyatt, Peter W. | |
dc.contributor.author | Checka, Nisha | |
dc.contributor.author | Kedzierski, Jakub T. | |
dc.contributor.author | Keast, Craig L. | |
dc.date.accessioned | 2012-10-18T20:41:30Z | |
dc.date.available | 2012-10-18T20:41:30Z | |
dc.date.issued | 2010-02 | |
dc.date.submitted | 2010-01 | |
dc.identifier.issn | 0018-9219 | |
dc.identifier.issn | 1558-2256 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/74123 | |
dc.description.abstract | Ultralow-power electronics will expand the technological capability of handheld and wireless devices by dramatically improving battery life and portability. In addition to innovative low-power design techniques, a complementary process technology is required to enable the highest performance devices possible while maintaining extremely low power consumption. Transistors optimized for subthreshold operation at 0.3 V may achieve a 97% reduction in switching energy compared to conventional transistors. The process technology described in this article takes advantage of the capacitance and performance benefits of thin-body silicon-on-insulator devices, combined with a workfunction engineered mid-gap metal gate. | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/jproc.2009.2034476 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | IEEE | en_US |
dc.title | FDSOI Process Technology for Subthreshold-Operation Ultralow-Power Electronics | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Vitale, S.A. et al. “FDSOI Process Technology for Subthreshold-Operation Ultralow-Power Electronics.” Proceedings of the IEEE 98.2 (2010): 333–342. © 2010 IEEE | en_US |
dc.contributor.department | Lincoln Laboratory | en_US |
dc.contributor.mitauthor | Vitale, Steven A. | |
dc.contributor.mitauthor | Wyatt, Peter W. | |
dc.contributor.mitauthor | Checka, Nisha | |
dc.contributor.mitauthor | Kedzierski, Jakub T. | |
dc.contributor.mitauthor | Keast, Craig L. | |
dc.relation.journal | Proceedings of the IEEE | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Vitale, S.A.; Wyatt, P.W.; Checka, N.; Kedzierski, J.; Keast, C.L. | en |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |