Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes
DownloadAPPLAB9419193102_1.pdf (235.1Kb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
Carbon-nanotube (CNT)-tipped atomic force microscope (AFM) probes were assembled in a deterministic and reproducible manner by transplanting a CNT bearing polymeric carrier to a microelectromechanical systems cantilever. Single-strand CNTs were grown vertically at predefined locations where each CNT was encapsulated into a cylindrical polymer carrier block. Double-layer carriers were used for controlling the release of blocks and the exposed length of CNT tips after the assembly. Much reduced complexity in assembly was achieved by transplanting individual CNTs to AFM probes, which could scan nanotrenches and biostructures with little probe artifacts.
Date issued
2009-05Department
Massachusetts Institute of Technology. Department of Mechanical EngineeringJournal
Applied Physics Letters
Publisher
American Institute of Physics
Citation
Kim, Soohyung, Hyung Woo Lee, and Sang-Gook Kim. “Transplanting Assembly of Carbon-nanotube-tipped Atomic Force Microscope Probes.” Applied Physics Letters 94.19 (2009): 193102. Web.
Version: Final published version
ISSN
0003-6951
1077-3118