| dc.contributor.author | Soohyung, Kim | |
| dc.contributor.author | Lee, Hyung Woo | |
| dc.contributor.author | Kim, Sang-Gook | |
| dc.date.accessioned | 2012-12-05T16:22:21Z | |
| dc.date.available | 2012-12-05T16:22:21Z | |
| dc.date.issued | 2009-05 | |
| dc.date.submitted | 2008-12 | |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.issn | 1077-3118 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/75217 | |
| dc.description.abstract | Carbon-nanotube (CNT)-tipped atomic force microscope (AFM) probes were assembled in a deterministic and reproducible manner by transplanting a CNT bearing polymeric carrier to a microelectromechanical systems cantilever. Single-strand CNTs were grown vertically at predefined locations where each CNT was encapsulated into a cylindrical polymer carrier block. Double-layer carriers were used for controlling the release of blocks and the exposed length of CNT tips after the assembly. Much reduced complexity in assembly was achieved by transplanting individual CNTs to AFM probes, which could scan nanotrenches and biostructures with little probe artifacts. | en_US |
| dc.description.sponsorship | United States. Defense Advanced Research Projects Agency (DARPA Machine Reading Program (DARPA Grant No. HR0011-06-1-0045) | en_US |
| dc.description.sponsorship | Korea Institute of Science and Technology. Intelligent Microsystems Center | en_US |
| dc.description.sponsorship | Hewlett-Packard Company | en_US |
| dc.language.iso | en_US | |
| dc.publisher | American Institute of Physics | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1063/1.3136762 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Kim | en_US |
| dc.title | Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Kim, Soohyung, Hyung Woo Lee, and Sang-Gook Kim. “Transplanting Assembly of Carbon-nanotube-tipped Atomic Force Microscope Probes.” Applied Physics Letters 94.19 (2009): 193102. Web. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
| dc.contributor.approver | Kim, Sang Gook | |
| dc.contributor.mitauthor | Soohyung, Kim | |
| dc.contributor.mitauthor | Lee, Hyung Woo | |
| dc.contributor.mitauthor | Kim, Sang-Gook | |
| dc.relation.journal | Applied Physics Letters | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Kim, Soohyung; Lee, Hyung Woo; Kim, Sang-Gook | en |
| dc.identifier.orcid | https://orcid.org/0000-0002-3125-3268 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
