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Dual baseline search for muon antineutrino disappearance at 0.1  eV[superscript 2]<Δm[superscript 2]<100  eV[superscript 2]

dc.contributor.authorBugel, Leonard G.
dc.contributor.authorConrad, Janet
dc.contributor.authorIgnarra, Christina
dc.contributor.authorJones, Benjamin James Poyner
dc.contributor.authorKaragiorgi, Georgia Stelios
dc.contributor.authorKatori, Teppei
dc.contributor.authorSpitz, Joshua B.
dc.contributor.authorTanaka, H. K.
dc.contributor.authorMcGary, Van Thanh
dc.date.accessioned2013-01-07T20:38:17Z
dc.date.available2013-01-07T20:38:17Z
dc.date.issued2012-09
dc.date.submitted2012-08
dc.identifier.issn1550-7998
dc.identifier.issn1089-4918
dc.identifier.urihttp://hdl.handle.net/1721.1/75859
dc.description.abstractThe MiniBooNE and SciBooNE collaborations report the results of a joint search for short baseline disappearance of ν̅[subscript μ] at Fermilab’s Booster Neutrino Beamline. The MiniBooNE Cherenkov detector and the SciBooNE tracking detector observe antineutrinos from the same beam, therefore the combined analysis of their data sets serves to partially constrain some of the flux and cross section uncertainties. Uncertainties in the ν[subscript μ] background were constrained by neutrino flux and cross section measurements performed in both detectors. A likelihood ratio method was used to set a 90% confidence level upper limit on ν̅[subscript μ] disappearance that dramatically improves upon prior limits in the Δm[superscript 2]=0.1–100  eV[superscript 2] region.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevD.86.052009en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleDual baseline search for muon antineutrino disappearance at 0.1  eV[superscript 2]<Δm[superscript 2]<100  eV[superscript 2]en_US
dc.typeArticleen_US
dc.identifier.citationCheng, G. et al. “Dual baseline search for muon antineutrino disappearance at 0.1  eV[superscript 2]<Δm[superscript 2]<100  eV[superscript 2].” Physical Review D 86.5 (2012). © 2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.mitauthorBugel, Leonard G.
dc.contributor.mitauthorConrad, Janet
dc.contributor.mitauthorIgnarra, Christina
dc.contributor.mitauthorJones, Benjamin James Poyner
dc.contributor.mitauthorKaragiorgi, Georgia Stelios
dc.contributor.mitauthorKatori, Teppei
dc.contributor.mitauthorSpitz, Joshua B.
dc.contributor.mitauthorTanaka, H. K.
dc.contributor.mitauthorMcGary, Van Thanh
dc.relation.journalPhysical Review Den_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsCheng, G.; Huelsnitz, W.; Aguilar-Arevalo, A.; Alcaraz-Aunion, J.; Brice, S.; Brown, B.; Bugel, L.; Catala-Perez, J.; Church, E.; Conrad, J.; Dharmapalan, R.; Djurcic, Z.; Dore, U.; Finley, D.; Ford, R.; Franke, A.; Garcia, F.; Garvey, G.; Giganti, C.; Gomez-Cadenas, J.; Grange, J.; Guzowski, P.; Hanson, A.; Hayato, Y.; Hiraide, K.; Ignarra, C.; Imlay, R.; Johnson, R.; Jones, B.; Jover-Manas, G.; Karagiorgi, G.; Katori, T.; Kobayashi, Y.; Kobilarcik, T.; Kubo, H.; Kurimoto, Y.; Louis, W.; Loverre, P.; Ludovici, L.; Mahn, K.; Mariani, C.; Marsh, W.; Masuike, S.; Matsuoka, K.; McGary, V.; Metcalf, W.; Mills, G.; Mirabal, J.; Mitsuka, G.; Miyachi, Y.; Mizugashira, S.; Moore, C.; Mousseau, J.; Nakajima, Y.; Nakaya, T.; Napora, R.; Nienaber, P.; Orme, D.; Osmanov, B.; Otani, M.; Pavlovic, Z.; Perevalov, D.; Polly, C.; Ray, H.; Roe, B.; Russell, A.; Sanchez, F.; Shaevitz, M.; Shibata, T.-A.; Sorel, M.; Spitz, J.; Stancu, I.; Stefanski, R.; Takei, H.; Tanaka, H.-K.; Tanaka, M.; Tayloe, R.; Taylor, I.; Tesarek, R.; Uchida, Y.; Van de Water, R.; Walding, J.; Wascko, M.; White, D.; White, H.; Wickremasinghe, D.; Yokoyama, M.; Zeller, G.; Zimmerman, E.en
dc.identifier.orcidhttps://orcid.org/0000-0002-9429-9482
dc.identifier.orcidhttps://orcid.org/0000-0002-6393-0438
dc.identifier.orcidhttps://orcid.org/0000-0003-3837-3921
dc.identifier.orcidhttps://orcid.org/0000-0001-6243-1453
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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