Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency
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Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.
Date issued
2013-04-10Department
Massachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Photovoltaic Research LaboratoryJournal
Proceedings of the 2010 35th IEEE Photovoltaic Specialists Conference (PVSC)
Publisher
Institute of Electrical and Electronics Engineers
Citation
Fenning, D. P. et al. “Synchrotron-based Microanalysis of Iron Distribution After Thermal Processing and Predictive Modeling of Resulting Solar Cell Efficiency.” 2010 35th IEEE Photovoltaic Specialists Conference (PVSC), 2010. 000430–000431. CrossRef. Web. © Copyright 2010 IEEE.
Version: Final published version
Other identifiers
INSPEC Accession Number: 11625647
ISBN
978-1-4244-5892-9
978-1-4244-5890-5
ISSN
0160-8371