Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency
Author(s)Fenning, David P.; Hofstetter, Jasmin; Bertoni, Mariana I.; Lelievre, J. F.; del Canizo, C.; Buonassisi, Tonio; ... Show more Show less
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Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry.
DepartmentMassachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Photovoltaic Research Laboratory
Proceedings of the 2010 35th IEEE Photovoltaic Specialists Conference (PVSC)
Institute of Electrical and Electronics Engineers
Fenning, D. P. et al. “Synchrotron-based Microanalysis of Iron Distribution After Thermal Processing and Predictive Modeling of Resulting Solar Cell Efficiency.” 2010 35th IEEE Photovoltaic Specialists Conference (PVSC), 2010. 000430–000431. CrossRef. Web. © Copyright 2010 IEEE.
Final published version
INSPEC Accession Number: 11625647