| dc.contributor.author | Fenning, David P. | |
| dc.contributor.author | Hofstetter, Jasmin | |
| dc.contributor.author | Bertoni, Mariana I. | |
| dc.contributor.author | Lelievre, J. F. | |
| dc.contributor.author | del Canizo, C. | |
| dc.contributor.author | Buonassisi, Tonio | |
| dc.date.accessioned | 2013-04-10T15:33:26Z | |
| dc.date.available | 2013-04-10T15:33:26Z | |
| dc.date.issued | 2013-04-10 | |
| dc.identifier.isbn | 978-1-4244-5892-9 | |
| dc.identifier.isbn | 978-1-4244-5890-5 | |
| dc.identifier.issn | 0160-8371 | |
| dc.identifier.other | INSPEC Accession Number: 11625647 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/78325 | |
| dc.description.abstract | Synchrotron-based X-ray fluorescence microscopy is applied to study the evolution of iron silicide precipitates during phosphorus diffusion gettering and low-temperature annealing. Heavily Fe-contaminated ingot border material contains FeSi2 precipitates after rapid in-line P-diffusion firing, suggesting kinetically limited gettering in these regions. An impurity-to-efficiency (I2E) gettering model is developed to explain the results. The model demonstrates the efficacy of high- and medium-temperature processing on reducing the interstitial iron population over a range of process parameters available to industry. | en_US |
| dc.description.sponsorship | United States. Dept. of Energy (contract number DE-FG36-09GO1900) | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (NSF Graduate Research Fellowship) | en_US |
| dc.description.sponsorship | Barcelona Chamber of Commerce (MIT-Spain/La Cambra de Barcelona Seed Fund) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1109/PVSC.2010.5616767 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | IEEE | en_US |
| dc.title | Synchrotron-based microanalysis of iron distribution after thermal processing and predictive modeling of resulting solar cell efficiency | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Fenning, D. P. et al. “Synchrotron-based Microanalysis of Iron Distribution After Thermal Processing and Predictive Modeling of Resulting Solar Cell Efficiency.” 2010 35th IEEE Photovoltaic Specialists Conference (PVSC), 2010. 000430–000431. CrossRef. Web. © Copyright 2010 IEEE. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Photovoltaic Research Laboratory | en_US |
| dc.contributor.mitauthor | Fenning, David P. | |
| dc.contributor.mitauthor | Bertoni, Mariana I. | |
| dc.contributor.mitauthor | Buonassisi, Tonio | |
| dc.relation.journal | Proceedings of the 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| dspace.orderedauthors | Fenning, D. P.; Hofstetter, J.; Bertoni, M. I.; Lelievre, J. F.; del Canizo, C.; Buonassisi, T. | en |
| dc.identifier.orcid | https://orcid.org/0000-0002-4609-9312 | |
| dc.identifier.orcid | https://orcid.org/0000-0001-8345-4937 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
