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dc.contributor.authorEsfarjani, Keivan
dc.contributor.authorChen, Gang
dc.contributor.authorChalopin, Yann
dc.contributor.authorHenry, A.
dc.contributor.authorVolz, S.
dc.date.accessioned2013-08-07T20:08:56Z
dc.date.available2013-08-07T20:08:56Z
dc.date.issued2012-05
dc.date.submitted2012-02
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/79797
dc.description.abstractWe provide a derivation allowing the calculation of thermal conductance at interfaces by equilibrium molecular dynamics simulations and illustrate our approach by studying thermal conduction mechanisms in Si/Ge superlattices. Thermal conductance calculations of superlattices with period thicknesses ranging from 0.5 to 60 nm are presented as well as the temperature dependence. Results have been compared to complementary Green-Kubo thermal conductivity calculations demonstrating that thermal conductivity of perfect superlattices can be directly deduced from interfacial conductance in the investigated period range. This confirms the predominant role of interfaces in materials with large phonon mean free paths.en_US
dc.description.sponsorshipSolid-State Solar-Thermal Energy Conversion Center (Grant DE-SC0001299)en_US
dc.description.sponsorshipSolid-State Solar-Thermal Energy Conversion Center (Grant DE-FG02-09ER46577)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://link.aps.org/doi/10.1103/PhysRevB.85.195302en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleThermal interface conductance in Si/Ge superlattices by equilibrium molecular dynamicsen_US
dc.typeArticleen_US
dc.identifier.citationChalopin, Y. et al. “Thermal Interface Conductance in Si/Ge Superlattices by Equilibrium Molecular Dynamics.” Physical Review B 85.19 (2012). ©2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorEsfarjani, Keivanen_US
dc.contributor.mitauthorChen, Gangen_US
dc.contributor.mitauthorChalopin, Yannen_US
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsChalopin, Y.; Esfarjani, K.; Henry, A.; Volz, S.; Chen, G.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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