MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Fluctuation-Induced Phenomena in Nanoscale Systems: Harnessing the Power of Noise

Author(s)
Reid, M. T. Homer; Rodriguez, Alejandro W.; Johnson, Steven G.
Thumbnail
DownloadJohnson_Fluctuation-induced phenomena.pdf (6.213Mb)
OPEN_ACCESS_POLICY

Open Access Policy

Creative Commons Attribution-Noncommercial-Share Alike

Terms of use
Creative Commons Attribution-Noncommercial-Share Alike 3.0 http://creativecommons.org/licenses/by-nc-sa/3.0/
Metadata
Show full item record
Abstract
The famous Johnson-Nyquist formula relating noise current to conductance has a microscopic generalization relating noise current density to microscopic conductivity, with corollary relations governing noise in the components of the electromagnetic fields. These relations, known collectively in physics as fluctuation-dissipation relations, form the basis of the modern understanding of fluctuation-induced phenomena, a field of burgeoning importance in experimental physics and nanotechnology. In this review, we survey recent progress in computational techniques for modeling fluctuation-induced phenomena, focusing on two cases of particular interest: near-field radiative heat transfer and Casimir forces. In each case we review the basic physics of the phenomenon, discuss semianalytical and numerical algorithms for theoretical analysis, and present recent predictions for novel phenomena in complex material and geometric configurations.
Description
Author's final manuscript July 19, 2012
Date issued
2013-02
URI
http://hdl.handle.net/1721.1/80353
Department
Massachusetts Institute of Technology. Department of Mathematics; Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
Proceedings of the IEEE
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Reid, M. T. Homer, Alejandro W. Rodriguez, and Steven G. Johnson. “Fluctuation-Induced Phenomena in Nanoscale Systems: Harnessing the Power of Noise.” Proceedings of the IEEE 101, no. 2 (February 2013): 531-545.
Version: Author's final manuscript
ISSN
0018-9219
1558-2256

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.