TID Tolerance of Popular CubeSat Components

Author(s)
Schmidt, Frank Hall; Cahoy, Kerri; Sklair, Devon A.; Blackwell, William J.; Osarentin, I.; ... Show more
Thumbnail
DownloadCahoy_TID Tolerance.pdf (137.4Kb)
OPEN_ACCESS_POLICY
Terms of use
Creative Commons Attribution-Noncommercial-Share Alike 3.0 http://creativecommons.org/licenses/by-nc-sa/3.0/
Metadata
Show full item record
Abstract
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cards
Date issued
2013-07
URI
http://hdl.handle.net/1721.1/81179
Department
Lincoln Laboratory; Massachusetts Institute of Technology. Department of Aeronautics and Astronautics; Massachusetts Institute of Technology. Space Systems Laboratory
Journal
Proceedings of the 50th Nuclear and Space Radiation Effects Conference 2013
Citation
R. Kingsbury, F. Schmidt, K. Cahoy, D. Sklair. "TID Tolerance of Popular CubeSat Components" 50th Nuclear and Space Radiation Effects Conference 2013.
Version: Author's final manuscript
Collections