TID Tolerance of Popular CubeSat Components
Author(s)Schmidt, Frank Hall; Cahoy, Kerri; Sklair, Devon A.; Blackwell, William J.; Osarentin, I.; Legge Jr, Robert S.; Kingsbury, Ryan W; ... Show more Show less
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In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cards
DepartmentLincoln Laboratory; Massachusetts Institute of Technology. Department of Aeronautics and Astronautics; Massachusetts Institute of Technology. Space Systems Laboratory
Proceedings of the 50th Nuclear and Space Radiation Effects Conference 2013
R. Kingsbury, F. Schmidt, K. Cahoy, D. Sklair. "TID Tolerance of Popular CubeSat Components" 50th Nuclear and Space Radiation Effects Conference 2013.
Author's final manuscript