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dc.contributor.authorChang, Jae-Byum
dc.contributor.authorSon, Jeong Gon
dc.contributor.authorHannon, Adam F.
dc.contributor.authorAlexander-Katz, Alfredo
dc.contributor.authorRoss, Caroline A.
dc.contributor.authorBerggren, Karl K.
dc.date.accessioned2013-10-03T20:36:34Z
dc.date.available2013-10-03T20:36:34Z
dc.date.issued2012-03
dc.date.submitted2011-10
dc.identifier.issn1936-0851
dc.identifier.issn1936-086X
dc.identifier.urihttp://hdl.handle.net/1721.1/81296
dc.description.abstractSelf-assembly of block copolymer films can generate useful periodic nanopatterns, but the self-assembly needs to be templated to impose long-range order and to control pattern registration with other substrate features. We demonstrate here the fabrication of aligned sub-10-nm line width patterns with a controlled orientation by using lithographically formed post arrays as templates for a 16 kg/mol poly(styrene-block-dimethylsiloxane) (PS-b-PDMS) diblock copolymer. The in-plane orientation of the block copolymer cylinders was controlled by varying the spacing and geometry of the posts, and the results were modeled using 3D self-consistent field theory. This work illustrates how arrays of narrow lines with specific in-plane orientation can be produced, and how the post height and diameter affect the self-assembly.en_US
dc.description.sponsorshipUnited States. Office of Naval Researchen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipSemiconductor Research Corporationen_US
dc.description.sponsorshipUniversity of California, Los Angeles. Center on Functional Engineered Nano Architectonicsen_US
dc.description.sponsorshipSamsung Electronics Co. (Scholarship foundation)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/nn203767sen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleAligned Sub-10-nm Block Copolymer Patterns Templated by Post Arraysen_US
dc.typeArticleen_US
dc.identifier.citationChang, Jae-Byum, Jeong Gon Son, Adam F. Hannon, Alfredo Alexander-Katz, Caroline A. Ross, and Karl K. Berggren. Aligned Sub-10-nm Block Copolymer Patterns Templated by Post Arrays. ACS Nano 6, no. 3 (March 27, 2012): 2071-2077.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorChang, Jae-Byumen_US
dc.contributor.mitauthorSon, Jeong Gonen_US
dc.contributor.mitauthorHannon, Adam F.en_US
dc.contributor.mitauthorAlexander-Katz, Alfredoen_US
dc.contributor.mitauthorRoss, Caroline A.en_US
dc.contributor.mitauthorBerggren, Karl K.en_US
dc.relation.journalACS Nanoen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsChang, Jae-Byum; Son, Jeong Gon; Hannon, Adam F.; Alexander-Katz, Alfredo; Ross, Caroline A.; Berggren, Karl K.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-2262-1249
dc.identifier.orcidhttps://orcid.org/0000-0003-3473-446X
dc.identifier.orcidhttps://orcid.org/0000-0001-7453-9031
dc.identifier.orcidhttps://orcid.org/0000-0001-5554-1283
dc.identifier.orcidhttps://orcid.org/0000-0003-2055-4900
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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