| dc.contributor.author | Hsiao, Yu-Chung | |
| dc.contributor.author | Daniel, Luca | |
| dc.date.accessioned | 2014-04-23T20:39:13Z | |
| dc.date.available | 2014-04-23T20:39:13Z | |
| dc.date.issued | 2011-06 | |
| dc.identifier.isbn | 978-1-4503-0636-2 | |
| dc.identifier.issn | 0738-100x | |
| dc.identifier.other | INSPEC Accession Number: 12180214 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/86226 | |
| dc.description.abstract | Traditional parallel boundary element methods suffer from low parallel efficiency and poor scalability due to the long system solving time bottleneck. In this paper, we demonstrate how to avoid such a bottleneck by using an instantiable basis function approach. In our demonstrated examples, we achieve 90% parallel efficiency and scalability both in shared memory and distributed memory parallel systems. | en_US |
| dc.description.sponsorship | Massachusetts Institute of Technology (Interconnect Focus Center) | en_US |
| dc.description.sponsorship | Semiconductor Research Corporation (Global Research Collaboration) | en_US |
| dc.description.sponsorship | Mentor Graphics (Firm) | en_US |
| dc.description.sponsorship | Advanced Micro Devices (Firm) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Association for Computing Machinery | en_US |
| dc.relation.isversionof | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5981976 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | MIT web domain | en_US |
| dc.title | A Highly Scalable Parallel Boundary Element Method for Capacitance Extraction | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Hsiao, Yu-Chung, Luca Daniel. "A highly scalable parallel boundary element method for capacitance extraction." 48th ACM/EDAC/IEEE Design Automation Conference (DAC 2011), June 5-10, 2011, San Diego, California, USA. p. 552-557. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Hsiao, Yu-Chung | en_US |
| dc.contributor.mitauthor | Daniel, Luca | en_US |
| dc.relation.journal | Proceedings of the 48th ACM/EDAC/IEEE Design Automation Conference (DAC), 2011 | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferenceItem | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dspace.orderedauthors | Hsiao, Yu-Chung; Daniel, Luca | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-5880-3151 | |
| mit.license | OPEN_ACCESS_POLICY | en_US |
| mit.metadata.status | Complete | |
