| dc.contributor.author | Han, Yehui | |
| dc.contributor.author | Perreault, David J. | |
| dc.date.accessioned | 2014-05-15T16:03:07Z | |
| dc.date.available | 2014-05-15T16:03:07Z | |
| dc.date.issued | 2006-09 | |
| dc.date.submitted | 2006-04 | |
| dc.identifier.issn | 0885-8993 | |
| dc.identifier.issn | 1941-0107 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/86989 | |
| dc.description.abstract | This letter presents analysis and design considerations for lumped (inductor and capacitor) matching networks operating at high efficiency (>95%). Formulas for calculating matching network efficiency are given, and it is shown that efficiency can be expressed as a function of inductor quality factor Q[subscript L], capacitor quality factor Q[subscript C], and transformation ratio. These formulas are used to evaluate the optimum number of L-section matching stages as a function of conversion ratio. Both simulation and experimental results are presented that validate the analytical formulation. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1109/TPEL.2006.882083 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Vabulas | en_US |
| dc.title | Analysis and Design of High Efficiency Matching Networks | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Han, Y., and D.J. Perreault. “Analysis and Design of High Efficiency Matching Networks.” IEEE Trans. Power Electron. 21, no. 5 (n.d.): 1484–1491. © 2006 IEEE | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Laboratory for Electromagnetic and Electronic Systems | en_US |
| dc.contributor.approver | Perreault, David J. | en_US |
| dc.contributor.mitauthor | Han, Yehui | en_US |
| dc.contributor.mitauthor | Perreault, David J. | en_US |
| dc.relation.journal | IEEE Transactions on Power Electronics | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Han, Y.; Perreault, D.J. | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-0746-6191 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
