Electrostatic Coupling between Two Surfaces of a Topological Insulator Nanodevice
Author(s)
Fatemi, Valla; Hunt, Benjamin Matthew; Steinberg, Hadar; Eltinge, Stephen L.; Mahmood, Fahad; Butch, Nicholas P.; Watanabe, Kenji; Taniguchi, Takashi; Gedik, Nuh; Jarillo-Herrero, Pablo; Ashoori, Raymond; ... Show more Show less
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We report on electronic transport measurements of dual-gated nanodevices of the low-carrier density topological insulator (TI) Bi[subscript 1.5]Sb[subscript 0.5]Te[subscript 1.7]Se[subscript 1.3]. In all devices, the upper and lower surface states are independently tunable to the Dirac point by the top and bottom gate electrodes. In thin devices, electric fields are found to penetrate through the bulk, indicating finite capacitive coupling between the surface states. A charging model allows us to use the penetrating electric field as a measurement of the intersurface capacitance C[subscript TI] and the surface state energy-density relationship μ(n), which is found to be consistent with independent angle-resolved photoemission spectroscopy measurements. At high magnetic fields, increased field penetration through the surface states is observed, strongly suggestive of the opening of a surface state band gap due to broken time-reversal symmetry.
Date issued
2014-11Department
Massachusetts Institute of Technology. Department of PhysicsJournal
Physical Review Letters
Publisher
American Physical Society
Citation
Fatemi, Valla, Benjamin Hunt, Hadar Steinberg, Stephen L. Eltinge, Fahad Mahmood, Nicholas P. Butch, Kenji Watanabe, et al. “Electrostatic Coupling Between Two Surfaces of a Topological Insulator Nanodevice.” Physical Review Letters 113, no. 20 (November 2014). © 2014 American Physical Society
Version: Final published version
ISSN
0031-9007
1079-7114