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dc.contributor.authorFatemi, Valla
dc.contributor.authorHunt, Benjamin Matthew
dc.contributor.authorSteinberg, Hadar
dc.contributor.authorEltinge, Stephen L.
dc.contributor.authorMahmood, Fahad
dc.contributor.authorButch, Nicholas P.
dc.contributor.authorWatanabe, Kenji
dc.contributor.authorTaniguchi, Takashi
dc.contributor.authorGedik, Nuh
dc.contributor.authorJarillo-Herrero, Pablo
dc.contributor.authorAshoori, Raymond
dc.date.accessioned2014-11-17T17:27:07Z
dc.date.available2014-11-17T17:27:07Z
dc.date.issued2014-11
dc.date.submitted2014-04
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/91590
dc.description.abstractWe report on electronic transport measurements of dual-gated nanodevices of the low-carrier density topological insulator (TI) Bi[subscript 1.5]Sb[subscript 0.5]Te[subscript 1.7]Se[subscript 1.3]. In all devices, the upper and lower surface states are independently tunable to the Dirac point by the top and bottom gate electrodes. In thin devices, electric fields are found to penetrate through the bulk, indicating finite capacitive coupling between the surface states. A charging model allows us to use the penetrating electric field as a measurement of the intersurface capacitance C[subscript TI] and the surface state energy-density relationship μ(n), which is found to be consistent with independent angle-resolved photoemission spectroscopy measurements. At high magnetic fields, increased field penetration through the surface states is observed, strongly suggestive of the opening of a surface state band gap due to broken time-reversal symmetry.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Division of Materials Sciences and Engineering (Award DE-SC0006418)en_US
dc.description.sponsorshipGordon and Betty Moore Foundation (Grant GBMF2931)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (STC Center for Integrated Quantum Materials Grant DMR-1231319)en_US
dc.description.sponsorshipNational Science Foundation (U.S.). Materials Research Science and Engineering Centers (Program) (Grant DMR-0819762)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.113.206801en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleElectrostatic Coupling between Two Surfaces of a Topological Insulator Nanodeviceen_US
dc.typeArticleen_US
dc.identifier.citationFatemi, Valla, Benjamin Hunt, Hadar Steinberg, Stephen L. Eltinge, Fahad Mahmood, Nicholas P. Butch, Kenji Watanabe, et al. “Electrostatic Coupling Between Two Surfaces of a Topological Insulator Nanodevice.” Physical Review Letters 113, no. 20 (November 2014). © 2014 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorFatemi, Vallaen_US
dc.contributor.mitauthorHunt, Benjamin Matthewen_US
dc.contributor.mitauthorSteinberg, Hadaren_US
dc.contributor.mitauthorEltinge, Stephen L.en_US
dc.contributor.mitauthorMahmood, Fahaden_US
dc.contributor.mitauthorGedik, Nuhen_US
dc.contributor.mitauthorAshoori, Raymonden_US
dc.contributor.mitauthorJarillo-Herrero, Pabloen_US
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2014-11-14T23:00:03Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsFatemi, Valla; Hunt, Benjamin; Steinberg, Hadar; Eltinge, Stephen L.; Mahmood, Fahad; Butch, Nicholas P.; Watanabe, Kenji; Taniguchi, Takashi; Gedik, Nuh; Ashoori, Raymond C.; Jarillo-Herrero, Pabloen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-9641-3453
dc.identifier.orcidhttps://orcid.org/0000-0002-6394-4987
dc.identifier.orcidhttps://orcid.org/0000-0003-3648-7706
dc.identifier.orcidhttps://orcid.org/0000-0001-8217-8213
dc.identifier.orcidhttps://orcid.org/0000-0001-5031-1673
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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