A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration
Author(s)
Chang, Albert H.; Lee, Hae-Seung; Boning, Duane S.
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A 12-bit 50MS/s SAR ADC implemented in 65nm CMOS technology is presented. The design employs redundancy to relax the DAC settling requirement and to provide sufficient room for errors such that the static nonlinearity caused by capacitor mismatches can be digitally removed. The redundancy is incorporated into the design using a tri-level switching scheme and our modified split-capacitor array to achieve the highest switching efficiency while still preserving the symmetry in error tolerance. A new code-density based digital background calibration algorithm that requires no special calibration signals or additional analog hardware is also developed. The calibration is performed by using the input signal as stimulus and the effectiveness is verified both in simulation and through measured data. The prototype achieves a 67.4dB SNDR at 50MS/s, while dissipating 2.1mW from a 1.2V supply, leading to FoM of 21.9fJ/conv.-step at Nyquist frequency.
Date issued
2013-09Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Microsystems Technology LaboratoriesJournal
2013 Proceedings of the ESSCIRC (ESSCIRC)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Chang, Albert H., Hae-Seung Lee, and Duane Boning. “A 12b 50MS/s 2.1mW SAR ADC with Redundancy and Digital Background Calibration.” 2013 Proceedings of the ESSCIRC (ESSCIRC) (September 2013).
Version: Author's final manuscript
ISBN
978-1-4799-0645-1
978-1-4799-0643-7
978-1-4799-0644-4
ISSN
1930-8833