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dc.contributor.authorChang, Albert H.
dc.contributor.authorLee, Hae-Seung
dc.contributor.authorBoning, Duane S.
dc.date.accessioned2014-12-22T15:52:08Z
dc.date.available2014-12-22T15:52:08Z
dc.date.issued2013-09
dc.identifier.isbn978-1-4799-0645-1
dc.identifier.isbn978-1-4799-0643-7
dc.identifier.isbn978-1-4799-0644-4
dc.identifier.issn1930-8833
dc.identifier.urihttp://hdl.handle.net/1721.1/92432
dc.description.abstractA 12-bit 50MS/s SAR ADC implemented in 65nm CMOS technology is presented. The design employs redundancy to relax the DAC settling requirement and to provide sufficient room for errors such that the static nonlinearity caused by capacitor mismatches can be digitally removed. The redundancy is incorporated into the design using a tri-level switching scheme and our modified split-capacitor array to achieve the highest switching efficiency while still preserving the symmetry in error tolerance. A new code-density based digital background calibration algorithm that requires no special calibration signals or additional analog hardware is also developed. The calibration is performed by using the input signal as stimulus and the effectiveness is verified both in simulation and through measured data. The prototype achieves a 67.4dB SNDR at 50MS/s, while dissipating 2.1mW from a 1.2V supply, leading to FoM of 21.9fJ/conv.-step at Nyquist frequency.en_US
dc.description.sponsorshipMIT Masdar Programen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ESSCIRC.2013.6649084en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceBoningen_US
dc.titleA 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibrationen_US
dc.typeArticleen_US
dc.identifier.citationChang, Albert H., Hae-Seung Lee, and Duane Boning. “A 12b 50MS/s 2.1mW SAR ADC with Redundancy and Digital Background Calibration.” 2013 Proceedings of the ESSCIRC (ESSCIRC) (September 2013).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.approverBoning, Duane S.en_US
dc.contributor.mitauthorChang, Albert H.en_US
dc.contributor.mitauthorLee, Hae-Seungen_US
dc.contributor.mitauthorBoning, Duane S.en_US
dc.relation.journal2013 Proceedings of the ESSCIRC (ESSCIRC)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsChang, Albert H.; Lee, Hae-Seung; Boning, Duaneen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-7783-0403
dc.identifier.orcidhttps://orcid.org/0000-0002-0417-445X
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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