dc.contributor.author | Iglesias, R. | |
dc.contributor.author | Demkowicz, Michael J. | |
dc.contributor.author | Gonzalez, C. | |
dc.date.accessioned | 2015-02-13T16:57:18Z | |
dc.date.available | 2015-02-13T16:57:18Z | |
dc.date.issued | 2015-02 | |
dc.date.submitted | 2015-01 | |
dc.identifier.issn | 1098-0121 | |
dc.identifier.issn | 1550-235X | |
dc.identifier.uri | http://hdl.handle.net/1721.1/94529 | |
dc.description.abstract | We present a comprehensive density functional theory (DFT) -based study of different aspects of one vacancy and He impurity atom behavior at semicoherent interfaces between the low-solubility transition metals Cu and Nb. Such interfaces have not been previously modeled using DFT. A thorough analysis of the stability and mobility of the two types of defects at the interfaces and neighboring internal layers has been performed and the results have been compared to the equivalent cases in the pure metallic matrices. The different behavior of fcc and bcc metals on both sides of the interface has been specifically assessed. The modeling effort undertaken is the first attempt to study the stability and defect energetics of noncoherent Cu/Nb interfaces from first principles, in order to assess their potential use in radiation-resistant materials. | en_US |
dc.description.sponsorship | Seventh Framework Programme (European Commission) (Project RAD-INTERFACES) | en_US |
dc.description.sponsorship | Spain. Ministerio de Economia y Competividad (Project NANO-EXTREM, Ref. MAT2012-38541) | en_US |
dc.description.sponsorship | United States. Dept. of Energy. Office of Basic Energy Sciences (Award 2008LANL1026) | en_US |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevB.91.064103 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | American Physical Society | en_US |
dc.title | Point defect stability in a semicoherent metallic interface | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Gonzalez, C., R. Iglesias, and M. J. Demkowicz. "Point defect stability in a semicoherent metallic interface." Phys. Rev. B 91, 064103 (February 2015). © 2015 American Physical Society | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.mitauthor | Demkowicz, Michael J. | en_US |
dc.relation.journal | Physical Review B | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2015-02-11T23:00:05Z | |
dc.language.rfc3066 | en | |
dc.rights.holder | American Physical Society | |
dspace.orderedauthors | Gonzalez, C.; Iglesias, R.; Demkowicz, M. J. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0003-3949-0441 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |