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dc.contributor.authorIglesias, R.
dc.contributor.authorDemkowicz, Michael J.
dc.contributor.authorGonzalez, C.
dc.date.accessioned2015-02-13T16:57:18Z
dc.date.available2015-02-13T16:57:18Z
dc.date.issued2015-02
dc.date.submitted2015-01
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/94529
dc.description.abstractWe present a comprehensive density functional theory (DFT) -based study of different aspects of one vacancy and He impurity atom behavior at semicoherent interfaces between the low-solubility transition metals Cu and Nb. Such interfaces have not been previously modeled using DFT. A thorough analysis of the stability and mobility of the two types of defects at the interfaces and neighboring internal layers has been performed and the results have been compared to the equivalent cases in the pure metallic matrices. The different behavior of fcc and bcc metals on both sides of the interface has been specifically assessed. The modeling effort undertaken is the first attempt to study the stability and defect energetics of noncoherent Cu/Nb interfaces from first principles, in order to assess their potential use in radiation-resistant materials.en_US
dc.description.sponsorshipSeventh Framework Programme (European Commission) (Project RAD-INTERFACES)en_US
dc.description.sponsorshipSpain. Ministerio de Economia y Competividad (Project NANO-EXTREM, Ref. MAT2012-38541)en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Basic Energy Sciences (Award 2008LANL1026)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.91.064103en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titlePoint defect stability in a semicoherent metallic interfaceen_US
dc.typeArticleen_US
dc.identifier.citationGonzalez, C., R. Iglesias, and M. J. Demkowicz. "Point defect stability in a semicoherent metallic interface." Phys. Rev. B 91, 064103 (February 2015). © 2015 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorDemkowicz, Michael J.en_US
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2015-02-11T23:00:05Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsGonzalez, C.; Iglesias, R.; Demkowicz, M. J.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-3949-0441
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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