Bayesian inference of substrate properties from film behavior
Author(s)Aggarwal, Raghav; Demkowicz, Michael J.; Marzouk, Youssef M.
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We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn–Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems.
DepartmentMassachusetts Institute of Technology. Department of Aeronautics and Astronautics; Massachusetts Institute of Technology. Department of Materials Science and Engineering; Massachusetts Institute of Technology. Department of Mechanical Engineering
Modelling and Simulation in Materials Science and Engineering
Aggarwal, R, M J Demkowicz, and Y M Marzouk. “Bayesian Inference of Substrate Properties from Film Behavior.” Modelling Simul. Mater. Sci. Eng. 23, no. 1 (December 19, 2014): 015009.
Author's final manuscript