dc.contributor.author | Aggarwal, Raghav | |
dc.contributor.author | Demkowicz, Michael J. | |
dc.contributor.author | Marzouk, Youssef M. | |
dc.date.accessioned | 2015-06-29T18:18:35Z | |
dc.date.available | 2015-06-29T18:18:35Z | |
dc.date.issued | 2014-12 | |
dc.date.submitted | 2014-05 | |
dc.identifier.issn | 0965-0393 | |
dc.identifier.issn | 1361-651X | |
dc.identifier.uri | http://hdl.handle.net/1721.1/97567 | |
dc.description.abstract | We demonstrate that by observing the behavior of a film deposited on a substrate, certain features of the substrate may be inferred with quantified uncertainty using Bayesian methods. We carry out this demonstration on an illustrative film/substrate model where the substrate is a Gaussian random field and the film is a two-component mixture that obeys the Cahn–Hilliard equation. We construct a stochastic reduced order model to describe the film/substrate interaction and use it to infer substrate properties from film behavior. This quantitative inference strategy may be adapted to other film/substrate systems. | en_US |
dc.description.sponsorship | United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0008926) | en_US |
dc.language.iso | en_US | |
dc.publisher | IOP Publishing | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1088/0965-0393/23/1/015009 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | R. Aggarwal (grad student) via Barbara Williams | en_US |
dc.title | Bayesian inference of substrate properties from film behavior | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Aggarwal, R, M J Demkowicz, and Y M Marzouk. “Bayesian Inference of Substrate Properties from Film Behavior.” Modelling Simul. Mater. Sci. Eng. 23, no. 1 (December 19, 2014): 015009. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
dc.contributor.approver | Aggarwal, Raghav | en_US |
dc.contributor.mitauthor | Aggarwal, Raghav | en_US |
dc.contributor.mitauthor | Demkowicz, Michael J. | en_US |
dc.contributor.mitauthor | Marzouk, Youssef M. | en_US |
dc.relation.journal | Modelling and Simulation in Materials Science and Engineering | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Aggarwal, R; Demkowicz, M J; Marzouk, Y M | en_US |
dc.identifier.orcid | https://orcid.org/0000-0001-5321-3489 | |
dc.identifier.orcid | https://orcid.org/0000-0001-8242-3290 | |
dc.identifier.orcid | https://orcid.org/0000-0003-3949-0441 | |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |