MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements

Author(s)
Kim, Jooil; Fraser, Paul J.; Li, Shanlan; Ganesan, Anita L.; Krummel, P. B.; Steele, L. Paul; Park, Sunyoung; Kim, Seung-Kyu; Park, Mi-Kyung; Arnold, Tim; Harth, Christina M.; Salameh, Peter K.; Prinn, Ronald G.; Weiss, Ray F.; Kim, Kyung-Ryul; Muhle, Jens; ... Show more Show less
Thumbnail
DownloadPrinn_Quantifying aluminum.pdf (427.8Kb)
PUBLISHER_POLICY

Publisher Policy

Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Abstract
The potent anthropogenic perfluorocarbon greenhouse gases tetrafluoromethane (CF[subscript 4]) and hexafluoroethane (C[subscript 2]F[subscript 6]) are emitted to the atmosphere mainly by the aluminum and semiconductor industries. Global emissions of these perfluorocarbons (PFCs) calculated from atmospheric measurements are significantly greater than expected from reported national and industry-based emission inventories. In this study, in situ measurements of the two PFCs in the Advanced Global Atmospheric Gases Experiment network are used to show that their emission ratio varies according to the relative regional presence of these two industries, providing an industry-specific emission “signature” to apportion the observed emissions. Our results suggest that underestimated emissions from the global semiconductor industry during 1990–2010, as well as from China's aluminum industry after 2002, account for the observed differences between emissions based on atmospheric measurements and on inventories. These differences are significant despite the large uncertainties in emissions based on the methodologies used by these industries.
Date issued
2014-07
URI
http://hdl.handle.net/1721.1/99154
Department
Massachusetts Institute of Technology. Center for Global Change Science
Journal
Geophysical Research Letters
Publisher
Wiley Blackwell
Citation
Kim, Jooil, Paul J. Fraser, Shanlan Li, Jens Mühle, Anita L. Ganesan, Paul B. Krummel, L. Paul Steele, et al. “Quantifying Aluminum and Semiconductor Industry Perfluorocarbon Emissions from Atmospheric Measurements.” Geophysical Research Letters (July 2014): n/a–n/a. © 2014 American Geophysical Union
Version: Final published version
ISSN
00948276

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.