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dc.contributor.authorKim, Jooil
dc.contributor.authorFraser, Paul J.
dc.contributor.authorLi, Shanlan
dc.contributor.authorGanesan, Anita L.
dc.contributor.authorKrummel, P. B.
dc.contributor.authorSteele, L. Paul
dc.contributor.authorPark, Sunyoung
dc.contributor.authorKim, Seung-Kyu
dc.contributor.authorPark, Mi-Kyung
dc.contributor.authorArnold, Tim
dc.contributor.authorHarth, Christina M.
dc.contributor.authorSalameh, Peter K.
dc.contributor.authorPrinn, Ronald G.
dc.contributor.authorWeiss, Ray F.
dc.contributor.authorKim, Kyung-Ryul
dc.contributor.authorMuhle, Jens
dc.date.accessioned2015-10-06T16:56:51Z
dc.date.available2015-10-06T16:56:51Z
dc.date.issued2014-07
dc.date.submitted2014-03
dc.identifier.issn00948276
dc.identifier.urihttp://hdl.handle.net/1721.1/99154
dc.description.abstractThe potent anthropogenic perfluorocarbon greenhouse gases tetrafluoromethane (CF[subscript 4]) and hexafluoroethane (C[subscript 2]F[subscript 6]) are emitted to the atmosphere mainly by the aluminum and semiconductor industries. Global emissions of these perfluorocarbons (PFCs) calculated from atmospheric measurements are significantly greater than expected from reported national and industry-based emission inventories. In this study, in situ measurements of the two PFCs in the Advanced Global Atmospheric Gases Experiment network are used to show that their emission ratio varies according to the relative regional presence of these two industries, providing an industry-specific emission “signature” to apportion the observed emissions. Our results suggest that underestimated emissions from the global semiconductor industry during 1990–2010, as well as from China's aluminum industry after 2002, account for the observed differences between emissions based on atmospheric measurements and on inventories. These differences are significant despite the large uncertainties in emissions based on the methodologies used by these industries.en_US
dc.description.sponsorshipUnited States. National Aeronautics and Space Administration (Upper Atmospheric Research Program Grant NNX11AF17G)en_US
dc.language.isoen_US
dc.publisherWiley Blackwellen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/2014GL059783en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceProf. Prinn via Chris Sherratten_US
dc.titleQuantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurementsen_US
dc.typeArticleen_US
dc.identifier.citationKim, Jooil, Paul J. Fraser, Shanlan Li, Jens Mühle, Anita L. Ganesan, Paul B. Krummel, L. Paul Steele, et al. “Quantifying Aluminum and Semiconductor Industry Perfluorocarbon Emissions from Atmospheric Measurements.” Geophysical Research Letters (July 2014): n/a–n/a. © 2014 American Geophysical Unionen_US
dc.contributor.departmentMassachusetts Institute of Technology. Center for Global Change Scienceen_US
dc.contributor.approverPrinn, Ronald G.en_US
dc.contributor.mitauthorGanesan, Anita L.en_US
dc.contributor.mitauthorPrinn, Ronald G.en_US
dc.relation.journalGeophysical Research Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKim, Jooil; Fraser, Paul J.; Li, Shanlan; Mühle, Jens; Ganesan, Anita L.; Krummel, Paul B.; Steele, L. Paul; Park, Sunyoung; Kim, Seung-Kyu; Park, Mi-Kyung; Arnold, Tim; Harth, Christina M.; Salameh, Peter K.; Prinn, Ronald G.; Weiss, Ray F.; Kim, Kyung-Ryulen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-5925-3801
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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