| dc.contributor.author | Sunter, Kristen A. | |
| dc.contributor.author | Lang, Christopher I. | |
| dc.contributor.author | Berggren, Karl K. | |
| dc.contributor.author | Dane, Andrew Edward | |
| dc.date.accessioned | 2015-11-09T14:18:41Z | |
| dc.date.available | 2015-11-09T14:18:41Z | |
| dc.date.issued | 2015-06 | |
| dc.identifier.issn | 0003-6935 | |
| dc.identifier.issn | 1539-4522 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/99749 | |
| dc.description.abstract | We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The infrared transmissometer reported here is easy to use, gives results within minutes, and is nondestructive. Thus, the thickness measurement can be easily integrated into the workflow of deposition and characterization. Comparison to a similar visible-wavelength transmissometer is provided. | en_US |
| dc.description.sponsorship | United States. Intelligence Advanced Research Projects Activity (United States. Air Force Research Laboratory FA8650-11-C-7105) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Optical Society of America | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1364/ao.54.005743 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | arXiv | en_US |
| dc.title | Infrared transmissometer to measure the thickness of NbN thin films | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Sunter, Kristen A., Andrew E. Dane, Christopher I. Lang, and Karl K. Berggren. “Infrared Transmissometer to Measure the Thickness of NbN Thin Films.” Applied Optics 54, no. 18 (2015): 5743. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
| dc.contributor.mitauthor | Sunter, Kristen A. | en_US |
| dc.contributor.mitauthor | Dane, Andrew Edward | en_US |
| dc.contributor.mitauthor | Lang, Christopher I. | en_US |
| dc.contributor.mitauthor | Berggren, Karl K. | en_US |
| dc.relation.journal | Applied Optics | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Sunter, Kristen A.; Dane, Andrew E.; Lang, Christopher I.; Berggren, Karl K. | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0003-3853-6516 | |
| dc.identifier.orcid | https://orcid.org/0000-0003-2480-767X | |
| dc.identifier.orcid | https://orcid.org/0000-0001-7453-9031 | |
| mit.license | OPEN_ACCESS_POLICY | en_US |
| mit.metadata.status | Complete | |
