dc.contributor.author | Liu, Frank | |
dc.contributor.author | Ross, Caroline A. | |
dc.date.accessioned | 2015-11-23T14:23:47Z | |
dc.date.available | 2015-11-23T14:23:47Z | |
dc.date.issued | 2015-11 | |
dc.date.submitted | 2015-10 | |
dc.identifier.issn | 2331-7019 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/99982 | |
dc.description.abstract | The magnetic switching behavior in continuous NiFe films patterned with IrMn gratings is investigated experimentally and with micromagnetic simulations. The samples made by a two-step deposition process consist of a 10-nm-thick NiFe layer on which is placed 10-nm-thick IrMn stripes with width from 100 to 500 nm and period from 240 nm to 1 μm. Exchange bias is introduced by field cooling in directions parallel or perpendicular to the IrMn stripes. The samples display a two-step hysteresis loop for higher stripe width and period, as the pinned and unpinned regions of the NiFe reverse independently but a one-step loop for lower stripe periods. The transition between these regimes is reproduced by micromagnetic modeling. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) | en_US |
dc.description.sponsorship | Semiconductor Research Corporation. Interconnect Focus Center | en_US |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevApplied.4.054005 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | American Physical Society | en_US |
dc.title | Magnetization Reversal in Ferromagnetic Films Patterned with Antiferromagnetic Gratings of Various Sizes | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Liu, F., and C. A. Ross. “Magnetization Reversal in Ferromagnetic Films Patterned with Antiferromagnetic Gratings of Various Sizes.” Physical Review Applied 4, no. 5 (November 2015). © 2015 American Physical Society | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.mitauthor | Liu, Frank | en_US |
dc.contributor.mitauthor | Ross, Caroline A. | en_US |
dc.relation.journal | Physical Review Applied | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2015-11-18T23:00:06Z | |
dc.language.rfc3066 | en | |
dc.rights.holder | American Physical Society | |
dspace.orderedauthors | Liu, F.; Ross, C. A. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0003-2262-1249 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |