dc.contributor.author | Laine, Hannu S. | |
dc.contributor.author | Vahlman, Henri | |
dc.contributor.author | Haarahiltunen, Antti | |
dc.contributor.author | Jensen, Mallory Ann | |
dc.contributor.author | Modanese, Chiara | |
dc.contributor.author | Wagner, Matthias | |
dc.contributor.author | Wolny, Franziska | |
dc.contributor.author | Buonassisi, Anthony | |
dc.contributor.author | Savin, Hele | |
dc.date.accessioned | 2021-12-13T17:00:56Z | |
dc.date.available | 2021-10-28T17:46:33Z | |
dc.date.available | 2021-12-13T17:00:56Z | |
dc.date.issued | 2018-03 | |
dc.identifier.isbn | 978-0-7354-1715-1 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/136720.2 | |
dc.description.sponsorship | National Science Foundation (U.S.) (CA No. EEC-1041895) | en_US |
dc.language.iso | en | |
dc.publisher | Author(s) | en_US |
dc.relation.isversionof | 10.1063/1.5049255 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | Other repository | en_US |
dc.title | Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Laine, Hannu S., Vahlman, Henri, Haarahiltunen, Antti, Jensen, Mallory A., Modanese, Chiara et al. 2018. "Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact." 1999. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
dc.relation.journal | SiliconPV 2018, The 8th International Conference on Crystalline Silicon Photovoltaics | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dc.date.updated | 2020-06-24T18:30:47Z | |
dspace.date.submission | 2020-06-24T18:30:50Z | |
mit.license | PUBLISHER_POLICY | |
mit.metadata.status | Publication Information Needed | en_US |